Free-carrier electro-refraction and electro-absorption modulation predictions for silicon over the 1-14µm infrared wavelength range


Nedeljkovic, Milos, Soref, Richard and Mashanovich, Goran Z. (2011) Free-carrier electro-refraction and electro-absorption modulation predictions for silicon over the 1-14µm infrared wavelength range. IEEE Photonics Journal, 3, (6), 1171-1180. (doi:10.1109/JPHOT.2011.2171930).

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Description/Abstract

We present relationships for the free-carrier-induced electrorefraction and electroabsorption in crystalline silicon over the 1-14-μm wavelength range. Electroabsorption modulation is calculated from impurity-doping spectra taken from the literature, and a Kramers-Kronig analysis of these spectra is used to predict electrorefraction modulation. More recent experimental results for terahertz absorption of silicon are also used to improve the commonly used 1.3- and 1.55-μm equations. We examine the wavelength dependence of electrorefraction and electroabsorption, finding that the predictions suggest longer wave modulator designs will, in many cases, be different from those used in the telecom range

Item Type: Article
ISSNs: 1943-0655 (print)
1943-0655 (electronic)
Keywords: absorption, electrooptic modulators, semiconductor impurities, silicon
Subjects: Q Science > QC Physics
T Technology > TK Electrical engineering. Electronics Nuclear engineering
Divisions: Faculty of Physical and Applied Science > Electronics and Computer Science > NANO
Item ID: 337781
Date Deposited: 03 May 2012 14:21
Last Modified: 20 Jun 2012 10:21
Contributors: Nedeljkovic, Milos (Author)
Soref, Richard (Author)
Mashanovich, Goran Z. (Author)
Date: December 2011
Status: Published
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/337781

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