Rectangular polysilicon nanowires by top-down lithography, dry etch and metal induced lateral crystallization


Sun, Kai, Hakim, M.M.A. and Ashburn, P (2012) Rectangular polysilicon nanowires by top-down lithography, dry etch and metal induced lateral crystallization. Electrochemical and Solid-State Letters, 15, (3), H62-H64. (doi:10.1149/2.011203esl).

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Description/Abstract

In this work, we demonstrate a low temperature polysilicon nanowire fabrication process using amorphous silicon deposition over an oxide pillar, anisotropic reactive ion etch and metal-induced lateral crystallization (MILC). The fabricated nanowires are rectangular, with a width and height of around 100 nm. MILC is successfully achieved at temperatures down to 450◦C, making the process compatible with glass substrates and hence suitable for low cost, disposable biosensors. Crystallisation lengths of 4.1 μm and 0.8 μm are obtained for 15 hour anneals at 480◦C and 450◦C, respectively

Item Type: Article
ISSNs: 1099-0062 (print)
1944-8775 (electronic)
Subjects: Q Science > QD Chemistry
T Technology > TK Electrical engineering. Electronics Nuclear engineering
Divisions: Faculty of Physical and Applied Science > Electronics and Computer Science > NANO
Item ID: 337929
Date Deposited: 04 May 2012 09:30
Last Modified: 26 Jul 2012 00:28
Contributors: Sun, Kai (Author)
Hakim, M.M.A. (Author)
Ashburn, P (Author)
Funder: Engineering and Physical Sciences Research Council
Date: March 2012
Status: Published
Further Information:Google Scholar
ISI Citation Count:1
URI: http://eprints.soton.ac.uk/id/eprint/337929

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