Speckle pattern characterisation for high resolution digital image correlation
Crammond, G., Boyd, S.W. and Dulieu-Barton, J.M. (2011) Speckle pattern characterisation for high resolution digital image correlation. Applied Mechanics and Materials, 70, 261-266. (doi:10.4028/www.scientific.net/AMM.70.261).
Full text not available from this repository.
Digital image correlation (DIC) is an optical technique for full field deformation measurement. The spatial resolution and precision of the measurements are limited by the number of pixels within the image. The use of magnifying optics provides greater spatial resolution images, enabling smaller displacements to be observed with greater accuracy. Increasing the magnification of an image significantly changes the appearance of the non-periodic, stochastic speckle pattern which provides the grey scale contrast necessary for the image correlation method. In the paper a methodology is developed to evaluate the properties of different speckle pattern types under a range of resolutions up to 1027 pixel / mm. Numerical deformation of the patterns is also undertaken to evaluate how the changes in the pattern properties affect the accuracy of the DIC measurements.
|Subjects:||T Technology > TJ Mechanical engineering and machinery|
|Divisions:||Faculty of Engineering and the Environment > Engineering Sciences
|Date Deposited:||17 May 2012 10:47|
|Last Modified:||26 Apr 2013 05:57|
|Contributors:||Crammond, G. (Author)
Boyd, S.W. (Author)
Dulieu-Barton, J.M. (Author)
|RDF:||RDF+N-Triples, RDF+N3, RDF+XML, Browse.|
Actions (login required)