New technique for loss measurement of a direct UV written silica-on-silicon waveguide using integrated Bragg grating structures

Rogers, H.L., Gates, J.C., Ambran, S. and Smith, P.G.R. (2010) New technique for loss measurement of a direct UV written silica-on-silicon waveguide using integrated Bragg grating structures. European Conference on Integrated Optics (ECIO) 2010, , Cambridge, United Kingdom. 07 - 09 Apr 2010. 2 pp .

Record type: Conference or Workshop Item (Paper)

Abstract

We present an elegant new method for measuring the loss of a silica-on-silicon waveguide using integrated Bragg grating structures. This technique has been used to measure the losses of UV written FHD waveguides exhibiting losses of 0.23dB/cm.

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e-pub ahead of print date: April 2010

Venue - Dates: European Conference on Integrated Optics (ECIO) 2010, , Cambridge, United Kingdom, 2010-04-07 - 2010-04-09

Keywords: direct UV written, Bragg grating, propagation loss, attenuation

Organisations: Optoelectronics Research Centre

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Identifiers

Local EPrints ID: 340888

URI: http://eprints.soton.ac.uk/id/eprint/340888

PURE UUID: 514fe828-4915-4f2a-a28d-e5c9b04dd13e

ORCID for J.C. Gates:

orcid.org/0000-0001-8671-5987

ORCID for P.G.R. Smith:

orcid.org/0000-0003-0319-718X

Catalogue record

Date deposited: 09 Jul 2012 14:01

Last modified: 15 Mar 2024 03:07

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Contributors

Author: H.L. Rogers

Author: J.C. Gates

Author: S. Ambran

Author: P.G.R. Smith

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