Analysis of dispersion characteristics of planar waveguides via multi-order interrogation of integrated Bragg gratings


Rogers, H.L., Holmes, C., Gates, J.C. and Smith, P.G.R. (2012) Analysis of dispersion characteristics of planar waveguides via multi-order interrogation of integrated Bragg gratings. IEEE Photonics Journal, 4, (2), 310-316. (doi:10.1109/JPHOT.2012.2186794).

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Description/Abstract

We demonstrate experimentally a simple technique to measure the wavelength-dependent effective refractive index of a waveguide utilizing integrated Bragg grating structures. A broadband measurement of the Bragg wavelengths yields the effective index of the waveguide and, thus, an accurate total dispersion relationship. An empirical calculation of the waveguide component of the dispersion yields both the waveguide and material dispersion components of the measured total dispersion. The technique allows direct measurement of the effective index of the waveguide and yields a zero dispersion wavelength at 1220.5 nm in our silica-on-silicon platform. Importantly, inclusion of second-order Bragg reflections improves the accuracy of modal refractive index for near-visible wavelengths

Item Type: Article
ISSNs: 1943-0655
Related URLs:
Subjects: Q Science > QC Physics
T Technology > TK Electrical engineering. Electronics Nuclear engineering
Divisions: Faculty of Physical Sciences and Engineering > Electronics and Computer Science
Faculty of Physical Sciences and Engineering > Optoelectronics Research Centre
Faculty of Physical Sciences and Engineering > Physics and Astronomy
ePrint ID: 341555
Date Deposited: 27 Jul 2012 10:22
Last Modified: 27 Mar 2014 20:24
Further Information:Google Scholar
ISI Citation Count:0
URI: http://eprints.soton.ac.uk/id/eprint/341555

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