Analysis of dispersion characteristics of planar waveguides via multi-order interrogation of integrated Bragg gratings
Rogers, H.L., Holmes, C., Gates, J.C. and Smith, P.G.R. (2012) Analysis of dispersion characteristics of planar waveguides via multi-order interrogation of integrated Bragg gratings. IEEE Photonics Journal, 4, (2), 310-316. (doi:10.1109/JPHOT.2012.2186794).
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We demonstrate experimentally a simple technique to measure the wavelength-dependent effective refractive index of a waveguide utilizing integrated Bragg grating structures. A broadband measurement of the Bragg wavelengths yields the effective index of the waveguide and, thus, an accurate total dispersion relationship. An empirical calculation of the waveguide component of the dispersion yields both the waveguide and material dispersion components of the measured total dispersion. The technique allows direct measurement of the effective index of the waveguide and yields a zero dispersion wavelength at 1220.5 nm in our silica-on-silicon platform. Importantly, inclusion of second-order Bragg reflections improves the accuracy of modal refractive index for near-visible wavelengths
|Digital Object Identifier (DOI):||doi:10.1109/JPHOT.2012.2186794|
|Subjects:||Q Science > QC Physics
T Technology > TK Electrical engineering. Electronics Nuclear engineering
|Divisions :||Faculty of Physical Sciences and Engineering > Electronics and Computer Science
Faculty of Physical Sciences and Engineering > Optoelectronics Research Centre
Faculty of Physical Sciences and Engineering > Physics and Astronomy
|Accepted Date and Publication Date:||
|Date Deposited:||27 Jul 2012 10:22|
|Last Modified:||31 Mar 2016 14:32|
|Further Information:||Google Scholar|
|RDF:||RDF+N-Triples, RDF+N3, RDF+XML, Browse.|
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