Security, user experience, acceptability attributes for the integration of physical and virtual identity access management systems


Alotaibi, Sara Jeza, Wald, Mike (2012) Security, user experience, acceptability attributes for the integration of physical and virtual identity access management systems. In, 2012 International Conference on Information Society (i-Society). The IEEE International Conference on Information Society (i-Society 2012) New York City, US, Institute of Electrical and Electronics Engineers, 277-282.

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Description/Abstract

A number of systems have been developed in the recent history to provide physical and virtual identity management systems; however, most have not been very successful. Furthermore, alongside increasing the level of awareness for the need to deploy interoperable physical and virtual identity management systems, there exists an immediate need for the establishment of clear standards and guidelines for the successful integration of the two mediums. The importance and motivation for the integration of the two mediums is discussed in this paper with respect to three perspectives: Security, which includes identity; User Experience, comprising Usability; and Acceptability, containing Accessibility. Not many systems abide by such guidelines for all of these perspectives; thus, our proposed system (UbIAMS) aims to change this and provide its users with access to their services from any identity access management system rather than merely providing access to a specific set of systems

Item Type: Book Section
ISBNs: 9781467308380
Alternative titles: Information Society (i-Society)
Related URLs:
Keywords: acceptability , physical and virtual identity access management systems , security , user experience
Subjects: T Technology > T Technology (General)
Divisions: Faculty of Physical Sciences and Engineering > Electronics and Computer Science > Web & Internet Science
ePrint ID: 342477
Date Deposited: 05 Sep 2012 08:34
Last Modified: 27 Mar 2014 20:24
Publisher: Institute of Electrical and Electronics Engineers
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/342477

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