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Polymer composites having large content of nanofiller: a case study involving epoxy

Polymer composites having large content of nanofiller: a case study involving epoxy
Polymer composites having large content of nanofiller: a case study involving epoxy
The situation where the polymer nanocomposite contains a large amount of organic filler was studied. An epoxy nanocomposite having a content of 20% wt of nanosilica was used. Emphasis was put on imaging at nanoscale and some dielectric responses were measured using dielectric spectroscopy. Using HAAD mode, an area of less than 4 nm surrounding an isolated particle was imaged and found to have a very low atomic number. Only with AFM in peak-force mode that agglomerates were clearly detected. Relative to the dielectric response, no interfacial relaxation peak was observed. In spite of some agglomeration, the real part of the permittivity was found to be increased by the adjunct of the nanofiller
978-1-4673-1252-3
541-546
Frechette, M.F.
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Preda, O.
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Krivda, A.
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Veillette, R.
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Trudeau, M.
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Vaughan, A.S.
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David, E.
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Couderc, H.
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Vanga, C.
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Castellon, J.
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Frechette, M.F.
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Preda, O.
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Krivda, A.
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Veillette, R.
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Trudeau, M.
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Vaughan, A.S.
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David, E.
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Couderc, H.
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Vanga, C.
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Castellon, J.
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Frechette, M.F., Preda, O., Krivda, A., Veillette, R., Trudeau, M., Vaughan, A.S., David, E., Couderc, H., Vanga, C. and Castellon, J. (2012) Polymer composites having large content of nanofiller: a case study involving epoxy. 2012 IEEE Conference on Electrical Insulation and Dielectric Phenomena, Montreal, Canada. 14 - 17 Oct 2012. pp. 541-546 .

Record type: Conference or Workshop Item (Paper)

Abstract

The situation where the polymer nanocomposite contains a large amount of organic filler was studied. An epoxy nanocomposite having a content of 20% wt of nanosilica was used. Emphasis was put on imaging at nanoscale and some dielectric responses were measured using dielectric spectroscopy. Using HAAD mode, an area of less than 4 nm surrounding an isolated particle was imaged and found to have a very low atomic number. Only with AFM in peak-force mode that agglomerates were clearly detected. Relative to the dielectric response, no interfacial relaxation peak was observed. In spite of some agglomeration, the real part of the permittivity was found to be increased by the adjunct of the nanofiller

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Published date: 14 October 2012
Venue - Dates: 2012 IEEE Conference on Electrical Insulation and Dielectric Phenomena, Montreal, Canada, 2012-10-14 - 2012-10-17
Organisations: EEE

Identifiers

Local EPrints ID: 344319
URI: http://eprints.soton.ac.uk/id/eprint/344319
ISBN: 978-1-4673-1252-3
PURE UUID: 82570991-548d-4fe6-9fe7-21c07fb65f37
ORCID for A.S. Vaughan: ORCID iD orcid.org/0000-0002-0535-513X

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Date deposited: 18 Oct 2012 10:21
Last modified: 15 Mar 2024 03:05

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Contributors

Author: M.F. Frechette
Author: O. Preda
Author: A. Krivda
Author: R. Veillette
Author: M. Trudeau
Author: A.S. Vaughan ORCID iD
Author: E. David
Author: H. Couderc
Author: C. Vanga
Author: J. Castellon

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