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An experimental analysis of the real contact area between an electrical contact and a glass plane

An experimental analysis of the real contact area between an electrical contact and a glass plane
An experimental analysis of the real contact area between an electrical contact and a glass plane
The exact contact between two rough surfaces is usually estimated using statistical mathematics and surface analysis before and after contact has occurred. To date the majority of real contact and loaded surfaces has been theoretical or by numerical analyses. A method of analysing real contact area under various loads, by utilizing a con-contact laser surface profiler, allows direct measurement of contact area and deformation in terms of contact force and plane displacement between two surfaces. A laser performs a scan through a transparent flat side supported in a fixed position above the base. A test contact, mounted atop a spring and force sensor, and a screw support which moves into contact with the transparent surface. This paper presents the analysis of real contact area of various surfaces under various loads. The surfaces analysed are a pair of Au coated hemispherical contacts, one is a used Au to Au coated multi-walled carbon nanotubes surface, from a MEMS relay application, the other a new contact surface of the same configuration.
carbon nanotubes, glasses, lasers, mathematics, microelectromechanical systems, numerical analysis, relays, sensors
876914
Quan, Chenggen
0359b47f-bcdc-4013-bc3b-1e477febce91
Down, Michael
a0e17c27-3737-445c-b47b-b6c3859fad16
Jiang, Liudi
374f2414-51f0-418f-a316-e7db0d6dc4d1
McBride, John W.
d9429c29-9361-4747-9ba3-376297cb8770
Qian, Kemao
79e56809-62cd-4df3-965a-f7c23a22f72e
Asundi, Anand
9df0b17e-005c-49ba-8976-11d76bff9443
Quan, Chenggen
0359b47f-bcdc-4013-bc3b-1e477febce91
Down, Michael
a0e17c27-3737-445c-b47b-b6c3859fad16
Jiang, Liudi
374f2414-51f0-418f-a316-e7db0d6dc4d1
McBride, John W.
d9429c29-9361-4747-9ba3-376297cb8770
Qian, Kemao
79e56809-62cd-4df3-965a-f7c23a22f72e
Asundi, Anand
9df0b17e-005c-49ba-8976-11d76bff9443

Quan, Chenggen, Down, Michael, Jiang, Liudi, McBride, John W., Qian, Kemao and Asundi, Anand (2013) An experimental analysis of the real contact area between an electrical contact and a glass plane. International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013), Singapore, Singapore. 09 Apr 2013. p. 876914 . (doi:10.1117/12.2021355).

Record type: Conference or Workshop Item (Paper)

Abstract

The exact contact between two rough surfaces is usually estimated using statistical mathematics and surface analysis before and after contact has occurred. To date the majority of real contact and loaded surfaces has been theoretical or by numerical analyses. A method of analysing real contact area under various loads, by utilizing a con-contact laser surface profiler, allows direct measurement of contact area and deformation in terms of contact force and plane displacement between two surfaces. A laser performs a scan through a transparent flat side supported in a fixed position above the base. A test contact, mounted atop a spring and force sensor, and a screw support which moves into contact with the transparent surface. This paper presents the analysis of real contact area of various surfaces under various loads. The surfaces analysed are a pair of Au coated hemispherical contacts, one is a used Au to Au coated multi-walled carbon nanotubes surface, from a MEMS relay application, the other a new contact surface of the same configuration.

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More information

Published date: 22 June 2013
Venue - Dates: International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013), Singapore, Singapore, 2013-04-09 - 2013-04-09
Keywords: carbon nanotubes, glasses, lasers, mathematics, microelectromechanical systems, numerical analysis, relays, sensors
Organisations: Mechatronics

Identifiers

Local EPrints ID: 355790
URI: http://eprints.soton.ac.uk/id/eprint/355790
PURE UUID: ae215fc7-38b9-4b30-b5b3-0eb3e1afa177
ORCID for Liudi Jiang: ORCID iD orcid.org/0000-0002-3400-825X
ORCID for John W. McBride: ORCID iD orcid.org/0000-0002-3024-0326

Catalogue record

Date deposited: 04 Apr 2014 10:17
Last modified: 15 Mar 2024 03:24

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Contributors

Author: Chenggen Quan
Author: Michael Down
Author: Liudi Jiang ORCID iD
Author: John W. McBride ORCID iD
Author: Kemao Qian
Author: Anand Asundi

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