Khan, Umar, Chong, H.M.H. and French, Mark (2013) Automated controller tuning for atomic force microscopes using estimation based multiple model switched adaptive control. 52nd IEEE Conference on Decision and Control, , Florence, Italy. 10 - 13 Dec 2013.
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Conference or Workshop Item
(Paper)
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Published date: 10 December 2013
Venue - Dates:
52nd IEEE Conference on Decision and Control, , Florence, Italy, 2013-12-10 - 2013-12-13
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Organisations:
Electronics & Computer Science
Identifiers
Local EPrints ID: 359878
URI: http://eprints.soton.ac.uk/id/eprint/359878
PURE UUID: 688ad9aa-dfea-4260-8d4d-77510a0af431
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Date deposited: 15 Nov 2013 14:40
Last modified: 15 Mar 2024 03:30
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Contributors
Author:
Umar Khan
Author:
H.M.H. Chong
Author:
Mark French
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