Qualitative SPICE modeling accounting for volatile dynamics of TiO2 memristors
Qualitative SPICE modeling accounting for volatile dynamics of TiO2 memristors
We propose a SPICE model that describes qualitatively real memristor device operation. Namely we introduce volatile effects, rate-dependent resistive switching and unipolar effects which can be tailored to influence together or separately the device's resistance. We compare our model's response to different real memristor device dynamics and conclude a high degree of similarity. We also fit our model to volatile resistive switching measured on one of our solid state TiO2 memristors.
Berdan, R.
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Khiat, A.
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Papavassiliou, C.
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Prodromakis, T.
d58c9c10-9d25-4d22-b155-06c8437acfbf
June 2014
Berdan, R.
082f1f5b-eaee-48a6-b728-414fc65f72bd
Khiat, A.
bf549ddd-5356-4a7d-9c12-eb6c0d904050
Papavassiliou, C.
5faf408a-ca30-47e5-8283-4a65536f91ff
Prodromakis, T.
d58c9c10-9d25-4d22-b155-06c8437acfbf
Berdan, R., Khiat, A., Papavassiliou, C. and Prodromakis, T.
(2014)
Qualitative SPICE modeling accounting for volatile dynamics of TiO2 memristors.
IEEE International Symposium on Circuits and Systems (ISCAS), Circuits & Systems Society Forum on Emerging & Selected Topics (CAS-FEST), Melbourne, Australia.
01 - 05 Jun 2014.
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Conference or Workshop Item
(Other)
Abstract
We propose a SPICE model that describes qualitatively real memristor device operation. Namely we introduce volatile effects, rate-dependent resistive switching and unipolar effects which can be tailored to influence together or separately the device's resistance. We compare our model's response to different real memristor device dynamics and conclude a high degree of similarity. We also fit our model to volatile resistive switching measured on one of our solid state TiO2 memristors.
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Published date: June 2014
Venue - Dates:
IEEE International Symposium on Circuits and Systems (ISCAS), Circuits & Systems Society Forum on Emerging & Selected Topics (CAS-FEST), Melbourne, Australia, 2014-06-01 - 2014-06-05
Organisations:
Nanoelectronics and Nanotechnology
Identifiers
Local EPrints ID: 362467
URI: http://eprints.soton.ac.uk/id/eprint/362467
PURE UUID: 43932af3-b688-4037-917f-b7725448ce6d
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Date deposited: 25 Feb 2014 11:40
Last modified: 05 Mar 2024 18:16
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Contributors
Author:
R. Berdan
Author:
A. Khiat
Author:
C. Papavassiliou
Author:
T. Prodromakis
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