Fiber optic probe of free electron evanescent fields in the optical frequency range
Fiber optic probe of free electron evanescent fields in the optical frequency range
We introduce an optical fiber platform which can be used to interrogate proximity interactions between free-electron evanescent fields and photonic nanostructures at optical frequencies in a manner similar to that in which optical evanescent fields are sampled using nanoscale aperture probes in scanning near-field microscopy. Conically profiled optical fiber tips functionalized with nano-gratings are employed to couple electron evanescent fields to light via the Smith-Purcell effect. We demonstrate the interrogation of medium energy (30-50 keV) electron fields with a lateral resolution of a few micrometers via the generation and detection of visible/UV radiation in the 700-300 nm (free-space) wavelength range.
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So, Jin-Kyu
06a7afea-61c2-439d-9ac4-047ea21a909b
MacDonald, Kevin F.
76c84116-aad1-4973-b917-7ca63935dba5
Zheludev, Nikolay I.
32fb6af7-97e4-4d11-bca6-805745e40cc6
19 May 2014
So, Jin-Kyu
06a7afea-61c2-439d-9ac4-047ea21a909b
MacDonald, Kevin F.
76c84116-aad1-4973-b917-7ca63935dba5
Zheludev, Nikolay I.
32fb6af7-97e4-4d11-bca6-805745e40cc6
So, Jin-Kyu, MacDonald, Kevin F. and Zheludev, Nikolay I.
(2014)
Fiber optic probe of free electron evanescent fields in the optical frequency range.
Applied Physics Letters, 104 (20), , [201101].
(doi:10.1063/1.4876395).
Abstract
We introduce an optical fiber platform which can be used to interrogate proximity interactions between free-electron evanescent fields and photonic nanostructures at optical frequencies in a manner similar to that in which optical evanescent fields are sampled using nanoscale aperture probes in scanning near-field microscopy. Conically profiled optical fiber tips functionalized with nano-gratings are employed to couple electron evanescent fields to light via the Smith-Purcell effect. We demonstrate the interrogation of medium energy (30-50 keV) electron fields with a lateral resolution of a few micrometers via the generation and detection of visible/UV radiation in the 700-300 nm (free-space) wavelength range.
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Published date: 19 May 2014
Organisations:
Optoelectronics Research Centre
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Local EPrints ID: 365088
URI: http://eprints.soton.ac.uk/id/eprint/365088
ISSN: 0003-6951
PURE UUID: d6c5b7f0-fc8e-43aa-808d-d83b1bfe2546
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Date deposited: 23 May 2014 08:35
Last modified: 15 Mar 2024 03:03
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Author:
Jin-Kyu So
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