Power consumption of fault tolerant codes: the active elements
Power consumption of fault tolerant codes: the active elements
0-7695-1968-7
61-67
Rossi, Daniele
30c42382-cf0a-447d-8695-fa229b7b8a2f
Van Dijk, V.E.S.
8936dddb-ac4d-42d3-91bc-08fa90efe2eb
Kleihorst, Richard
607853e6-6c51-47a4-8e85-f0d42aedfed5
Nieuwland, Andre'
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Metra, Cecilia
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July 2003
Rossi, Daniele
30c42382-cf0a-447d-8695-fa229b7b8a2f
Van Dijk, V.E.S.
8936dddb-ac4d-42d3-91bc-08fa90efe2eb
Kleihorst, Richard
607853e6-6c51-47a4-8e85-f0d42aedfed5
Nieuwland, Andre'
dacdd71c-3302-43af-81a6-db1b540285a5
Metra, Cecilia
c420be13-a9cf-471a-96fb-3f43a694ffae
Rossi, Daniele, Van Dijk, V.E.S., Kleihorst, Richard, Nieuwland, Andre' and Metra, Cecilia
(2003)
Power consumption of fault tolerant codes: the active elements.
9th IEEE International On-Line Testing Symposium, Kos Island, Greece.
07 - 09 Jul 2003.
.
(doi:10.1109/OLT.2003.1214368).
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Conference or Workshop Item
(Paper)
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Published date: July 2003
Venue - Dates:
9th IEEE International On-Line Testing Symposium, Kos Island, Greece, 2003-07-07 - 2003-07-09
Organisations:
Electronic & Software Systems
Identifiers
Local EPrints ID: 368877
URI: http://eprints.soton.ac.uk/id/eprint/368877
ISBN: 0-7695-1968-7
PURE UUID: 11df3e29-ff58-4c4c-8da5-7d84f74d3ac5
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Date deposited: 06 Oct 2014 12:20
Last modified: 14 Mar 2024 17:55
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Contributors
Author:
Daniele Rossi
Author:
V.E.S. Van Dijk
Author:
Richard Kleihorst
Author:
Andre' Nieuwland
Author:
Cecilia Metra
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