Transient fault and soft error on-die monitoring scheme
Transient fault and soft error on-die monitoring scheme
In this paper we propose an on-die monitoring scheme to detect and count transient faults (TFs) resulting, as well as not resulting in output SEs, affecting the inputs of data-path latches/flip-flops. This approach allows an early monitoring of the latches/flip-flops vulnerability to TFs, thus discovering intrinsic weaknesses of design or process. The proposed monitoring scheme features a very low impact on area overhead and power consumption, thus being suitable to be deployed within any IC.
transient faults, early monitoring scheme, soft errors
978-0-7695-4243-0
391-398
Rossi, Daniele
30c42382-cf0a-447d-8695-fa229b7b8a2f
Omana, Martin
7c091df8-0526-4d15-aa3f-f25dea90dd18
Metra, Cecilia
c420be13-a9cf-471a-96fb-3f43a694ffae
Rossi, Daniele
30c42382-cf0a-447d-8695-fa229b7b8a2f
Omana, Martin
7c091df8-0526-4d15-aa3f-f25dea90dd18
Metra, Cecilia
c420be13-a9cf-471a-96fb-3f43a694ffae
Rossi, Daniele, Omana, Martin and Metra, Cecilia
(2010)
Transient fault and soft error on-die monitoring scheme.
25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, Kyoto, Japan.
06 - 08 Oct 2010.
.
(doi:10.1109/DFT.2010.53).
Record type:
Conference or Workshop Item
(Paper)
Abstract
In this paper we propose an on-die monitoring scheme to detect and count transient faults (TFs) resulting, as well as not resulting in output SEs, affecting the inputs of data-path latches/flip-flops. This approach allows an early monitoring of the latches/flip-flops vulnerability to TFs, thus discovering intrinsic weaknesses of design or process. The proposed monitoring scheme features a very low impact on area overhead and power consumption, thus being suitable to be deployed within any IC.
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e-pub ahead of print date: October 2010
Venue - Dates:
25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, Kyoto, Japan, 2010-10-06 - 2010-10-08
Keywords:
transient faults, early monitoring scheme, soft errors
Organisations:
Electronic & Software Systems
Identifiers
Local EPrints ID: 368912
URI: http://eprints.soton.ac.uk/id/eprint/368912
ISBN: 978-0-7695-4243-0
PURE UUID: 03392146-9af6-487c-851c-d564e9545c4a
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Date deposited: 17 Sep 2014 09:46
Last modified: 14 Mar 2024 17:56
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Contributors
Author:
Daniele Rossi
Author:
Martin Omana
Author:
Cecilia Metra
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