(Er3+, Yb3+) doped K(Y,Gd,Lu)W waveguide fabrication
(Er3+, Yb3+) doped K(Y,Gd,Lu)W waveguide fabrication
In this work the fabrication and characterization of (Er3+,Yb3+) doped K(Y,Gd,Lu)W waveguides are presented. The KYW substrate is obtained by the Top-Seeded Solution Growth technique, and the active guiding layer is grown by Liquid Phase Epitaxy. While this process gives rise to planar waveguides, an ion milling structuring technique has been additionally used to provide lateral confinement to fabricate channel waveguides. The waveguide characterization includes refractive index measurements of the substrate and core regions, geometry of the ridge waveguides, and spectroscopy of the active ions around 1.55 µm. - BPM has been used to obtain the modal intensity profiles to estimate the optical confinement of the guided modes.
Martínez de Mendíbil, J.
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Cantelar, E.
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Lifante, G.
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Murugan, G.S.
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Wilkinson, J.S.
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Berrospe, C.
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Mateos, X.
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Bolaños, W.
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Carvajal, J.J.
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Aguiló, M.
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Díaz, F.
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Martínez de Mendíbil, J.
422c7dc7-0371-4817-a177-48f1ac8ba785
Cantelar, E.
811a8081-db2b-42f1-b978-7f0c7eb62cd2
Lifante, G.
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Murugan, G.S.
a867686e-0535-46cc-ad85-c2342086b25b
Wilkinson, J.S.
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Berrospe, C.
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Mateos, X.
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Bolaños, W.
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Carvajal, J.J.
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Aguiló, M.
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Díaz, F.
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Martínez de Mendíbil, J., Cantelar, E., Lifante, G., Murugan, G.S., Wilkinson, J.S., Berrospe, C., Mateos, X., Bolaños, W., Carvajal, J.J., Aguiló, M. and Díaz, F.
(2012)
(Er3+, Yb3+) doped K(Y,Gd,Lu)W waveguide fabrication.
European Conference on Integrated Optics (ECIO), Sitges Barcelona, Sitges, Spain.
18 - 24 Apr 2012.
Record type:
Conference or Workshop Item
(Paper)
Abstract
In this work the fabrication and characterization of (Er3+,Yb3+) doped K(Y,Gd,Lu)W waveguides are presented. The KYW substrate is obtained by the Top-Seeded Solution Growth technique, and the active guiding layer is grown by Liquid Phase Epitaxy. While this process gives rise to planar waveguides, an ion milling structuring technique has been additionally used to provide lateral confinement to fabricate channel waveguides. The waveguide characterization includes refractive index measurements of the substrate and core regions, geometry of the ridge waveguides, and spectroscopy of the active ions around 1.55 µm. - BPM has been used to obtain the modal intensity profiles to estimate the optical confinement of the guided modes.
More information
e-pub ahead of print date: 2012
Venue - Dates:
European Conference on Integrated Optics (ECIO), Sitges Barcelona, Sitges, Spain, 2012-04-18 - 2012-04-24
Organisations:
Optoelectronics Research Centre
Identifiers
Local EPrints ID: 376396
URI: http://eprints.soton.ac.uk/id/eprint/376396
PURE UUID: 8f4294c5-2aba-497a-8b63-6e2f2abe7d39
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Date deposited: 22 Apr 2015 15:33
Last modified: 15 Mar 2024 03:23
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Contributors
Author:
J. Martínez de Mendíbil
Author:
E. Cantelar
Author:
G. Lifante
Author:
C. Berrospe
Author:
X. Mateos
Author:
W. Bolaños
Author:
J.J. Carvajal
Author:
M. Aguiló
Author:
F. Díaz
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