Oscillatory thickness dependence of the coercive field in magnetic three-dimensional antidot arrays
Oscillatory thickness dependence of the coercive field in magnetic three-dimensional antidot arrays
Recent developments in magnetic applications, such as data storage, sensors, and transducers, are stimulating intense research into magnetism on submicrometer-length scales. Emerging self-assembly fabrication techniques have been proposed as viable, low-cost methods to prepare such submicron structures. In this letter we present studies on magnetic nanostructures with 3D architectures, fabricated using a self-assembly template method. We find that the patterning transverse to the film plane, which is a unique feature of this method, governs the magnetic behavior. In particular, the coercive field, a key parameter for magnetic materials, was found to demonstrate an oscillatory dependence on film thickness
1-4
Zhukov, A.A.
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Goncharov, A.V.
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de Groot, P.A.J.
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Ghanem, M.A.
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Bartlett, P.N.
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Boardman, R.
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Fangohr, H.
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Novosad, V.
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Karapetrov, G.
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2006
Zhukov, A.A.
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Goncharov, A.V.
c1a847e7-1bfe-4517-bc2a-f70b65df613b
de Groot, P.A.J.
98c21141-cf90-4e5c-8f2b-d2aae8efb84d
Ghanem, M.A.
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Bartlett, P.N.
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Boardman, R.
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Fangohr, H.
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Novosad, V.
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Karapetrov, G.
aadd9be9-46ff-470a-a04e-5e3f6391f5e7
Zhukov, A.A., Goncharov, A.V., de Groot, P.A.J., Ghanem, M.A., Bartlett, P.N., Boardman, R., Fangohr, H., Novosad, V. and Karapetrov, G.
(2006)
Oscillatory thickness dependence of the coercive field in magnetic three-dimensional antidot arrays.
Applied Physics Letters, 88 (6), .
(doi:10.1063/1.2171792).
Abstract
Recent developments in magnetic applications, such as data storage, sensors, and transducers, are stimulating intense research into magnetism on submicrometer-length scales. Emerging self-assembly fabrication techniques have been proposed as viable, low-cost methods to prepare such submicron structures. In this letter we present studies on magnetic nanostructures with 3D architectures, fabricated using a self-assembly template method. We find that the patterning transverse to the film plane, which is a unique feature of this method, governs the magnetic behavior. In particular, the coercive field, a key parameter for magnetic materials, was found to demonstrate an oscillatory dependence on film thickness
Text
Zhuk_06pp.pdf
- Accepted Manuscript
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Published date: 2006
Additional Information:
62511
Identifiers
Local EPrints ID: 37659
URI: http://eprints.soton.ac.uk/id/eprint/37659
ISSN: 0003-6951
PURE UUID: 2701c40a-a2f2-437a-b69b-683c8214af2e
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Date deposited: 25 May 2006
Last modified: 16 Mar 2024 03:36
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Contributors
Author:
A.A. Zhukov
Author:
A.V. Goncharov
Author:
P.A.J. de Groot
Author:
M.A. Ghanem
Author:
V. Novosad
Author:
G. Karapetrov
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