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Single and variable-state-skip LFSRs: bridging the gap between test data compression and test set embedding for IP cores

Single and variable-state-skip LFSRs: bridging the gap between test data compression and test set embedding for IP cores
Single and variable-state-skip LFSRs: bridging the gap between test data compression and test set embedding for IP cores
Even though test set embedding (TSE) methods offer very high compression efficiency, their excessively long test application times prohibit their use for testing systems-on-chip (SoC). To alleviate this problem we present two new types of linear feedback shift registers (LFSRs), the Single-State-Skip and the Variable-State-Skip LFSRs. Both are normal LFSRs with the addition of the State-Skip circuit, which is used instead of the characteristic-polynomial feedback structure for performing successive jumps of constant and variable length in their state sequence. By using Single-State-Skip LFSRs for testing single or multiple identical cores and Variable-State-Skip LFSRs for testing multiple non-identical cores we get the well-known high compression efficiency of TSE with substantially reduced test sequences, thus bridging the gap between test data compression and TSE methods.
1640-1644
Tenentes, Vasileios
1bff9ebc-9186-438b-850e-6c738994fa39
Kavousianos, X.
cd133613-8c16-46cf-a5be-91fd825e47cd
Kalligeros, E.
44108d52-f42c-4c02-9eb3-9efe9dea45ab
Tenentes, Vasileios
1bff9ebc-9186-438b-850e-6c738994fa39
Kavousianos, X.
cd133613-8c16-46cf-a5be-91fd825e47cd
Kalligeros, E.
44108d52-f42c-4c02-9eb3-9efe9dea45ab

Tenentes, Vasileios, Kavousianos, X. and Kalligeros, E. (2010) Single and variable-state-skip LFSRs: bridging the gap between test data compression and test set embedding for IP cores. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 29 (10), 1640-1644. (doi:10.1109/TCAD.2010.2051096).

Record type: Article

Abstract

Even though test set embedding (TSE) methods offer very high compression efficiency, their excessively long test application times prohibit their use for testing systems-on-chip (SoC). To alleviate this problem we present two new types of linear feedback shift registers (LFSRs), the Single-State-Skip and the Variable-State-Skip LFSRs. Both are normal LFSRs with the addition of the State-Skip circuit, which is used instead of the characteristic-polynomial feedback structure for performing successive jumps of constant and variable length in their state sequence. By using Single-State-Skip LFSRs for testing single or multiple identical cores and Variable-State-Skip LFSRs for testing multiple non-identical cores we get the well-known high compression efficiency of TSE with substantially reduced test sequences, thus bridging the gap between test data compression and TSE methods.

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Published date: 1 October 2010
Organisations: Electronic & Software Systems

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Local EPrints ID: 377313
URI: http://eprints.soton.ac.uk/id/eprint/377313
PURE UUID: c45de6e2-40f5-4a7a-a6f7-c3dfcddf9df5

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Date deposited: 11 Jun 2015 11:14
Last modified: 14 Mar 2024 20:00

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Contributors

Author: Vasileios Tenentes
Author: X. Kavousianos
Author: E. Kalligeros

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