Defect-oriented LFSR reseeding to target unmodeled defects using stuck-at test sets

Kavousianos, X., Tenentes, V., Chakrabarty, K. and Kalligeros, E. (2011) Defect-oriented LFSR reseeding to target unmodeled defects using stuck-at test sets. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 19 (12), 2330-2335. (doi:10.1109/TVLSI.2010.2079961).

Record type: Article

Abstract

Defect screening is a major challenge for nanoscale CMOS circuits, especially since many defects cannot be accurately modeled using known fault models. The effectiveness of test methods for such circuits can therefore be measured in terms of the coverage obtained for unmodeled faults. In this paper, we present a new defect-oriented dynamic LFSR reseeding technique for test-data compression. The proposed technique is based on a new output-deviation metric for grading stuck-at patterns derived from LFSR seeds. We show that, compared to standard compression-driven dynamic LFSR reseeding and a previously proposed deviation-based method, higher defect coverage is obtained using stuck-at test cubes without any loss of compression.

Text

Tenentes_TVLSI_2010.pdf - Version of Record

Restricted to Repository staff only

Request a copy