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Defect coverage-driven window-based test compression

Defect coverage-driven window-based test compression
Defect coverage-driven window-based test compression
Although LFSR reseeding based on test cubes for modeled faults is an efficient test compression approach, it suffers from the drawback of limited, and often unpredictable, coverage of unmodeled defects. We present a new defect coverage-driven window-based LFSR reseeding technique, which offers both high test quality and high compression. The efficiency of the proposed encoding technique in detecting defects is boosted by an efficient “output deviations” metric for grading the calculated LFSR seeds. We show that, compared to standard compression-driven LFSR reseeding, higher defect coverage is obtained without any loss of compression.
978-1-4244-8841-4
141-146
Kavousianos, Xrysovalantis
14d8650d-52d0-410d-b3f4-b54a0c620bab
Chakrabarty, Krishnendu
a8afcb71-145f-4def-ac52-e03ecc47863f
Kalligeros, Emmanouil
40cea4e5-9018-4bdc-bcf1-18e97143ec45
Tenentes, Vasileios
1bff9ebc-9186-438b-850e-6c738994fa39
Kavousianos, Xrysovalantis
14d8650d-52d0-410d-b3f4-b54a0c620bab
Chakrabarty, Krishnendu
a8afcb71-145f-4def-ac52-e03ecc47863f
Kalligeros, Emmanouil
40cea4e5-9018-4bdc-bcf1-18e97143ec45
Tenentes, Vasileios
1bff9ebc-9186-438b-850e-6c738994fa39

Kavousianos, Xrysovalantis, Chakrabarty, Krishnendu, Kalligeros, Emmanouil and Tenentes, Vasileios (2010) Defect coverage-driven window-based test compression. 19th Asian Test Symposium (ATS), Shanghai, China. 01 - 04 Dec 2010. pp. 141-146 . (doi:10.1109/ATS.2010.33).

Record type: Conference or Workshop Item (Paper)

Abstract

Although LFSR reseeding based on test cubes for modeled faults is an efficient test compression approach, it suffers from the drawback of limited, and often unpredictable, coverage of unmodeled defects. We present a new defect coverage-driven window-based LFSR reseeding technique, which offers both high test quality and high compression. The efficiency of the proposed encoding technique in detecting defects is boosted by an efficient “output deviations” metric for grading the calculated LFSR seeds. We show that, compared to standard compression-driven LFSR reseeding, higher defect coverage is obtained without any loss of compression.

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More information

Published date: December 2010
Venue - Dates: 19th Asian Test Symposium (ATS), Shanghai, China, 2010-12-01 - 2010-12-04
Organisations: Electronic & Software Systems

Identifiers

Local EPrints ID: 377975
URI: http://eprints.soton.ac.uk/id/eprint/377975
ISBN: 978-1-4244-8841-4
PURE UUID: ac85b108-4168-4abe-8644-41123cd58315

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Date deposited: 23 Jun 2015 10:29
Last modified: 14 Mar 2024 20:13

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Contributors

Author: Xrysovalantis Kavousianos
Author: Krishnendu Chakrabarty
Author: Emmanouil Kalligeros
Author: Vasileios Tenentes

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