Trapping parameters estimation of fresh and thermally-aged low-density polyethylene by using an improved trapping/detrapping model
Trapping parameters estimation of fresh and thermally-aged low-density polyethylene by using an improved trapping/detrapping model
In the present paper, trapping parameters of normal and thermally aged low-density polyethylene (LDPE) samples were estimated using the improved charge dynamic model. The results show that, after long-term thermal ageing process, the injection barrier of both electrons and holes is lowered, the overall trap depth is shallower and electron trap density becomes much greater. The latter may indicate that electrons are more sensitive to ageing than those of holes.
9781467374989
Liu, Ning
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Li, Ziyun
e8f18288-a1f9-4e9d-9457-b4df24e172ab
Chen, George
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Fu, Mingli
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Li, Ruihai
9c47dd03-c208-471f-81ef-7f5281b58332
Hou, Shuai
cab140b3-1a0f-4db3-8246-c65ca43589c5
18 October 2015
Liu, Ning
f7db88b0-49eb-4cc4-9d98-c73be7da1784
Li, Ziyun
e8f18288-a1f9-4e9d-9457-b4df24e172ab
Chen, George
3de45a9c-6c9a-4bcb-90c3-d7e26be21819
Fu, Mingli
4243dd1d-68a9-43b3-b339-f8f8a28f217f
Li, Ruihai
9c47dd03-c208-471f-81ef-7f5281b58332
Hou, Shuai
cab140b3-1a0f-4db3-8246-c65ca43589c5
Liu, Ning, Li, Ziyun, Chen, George, Fu, Mingli, Li, Ruihai and Hou, Shuai
(2015)
Trapping parameters estimation of fresh and thermally-aged low-density polyethylene by using an improved trapping/detrapping model.
IEEE Conference on Electrical Insulation and Dielectric Phenomena, Ann Arbor, United States.
18 - 20 Oct 2015.
4 pp
.
Record type:
Conference or Workshop Item
(Paper)
Abstract
In the present paper, trapping parameters of normal and thermally aged low-density polyethylene (LDPE) samples were estimated using the improved charge dynamic model. The results show that, after long-term thermal ageing process, the injection barrier of both electrons and holes is lowered, the overall trap depth is shallower and electron trap density becomes much greater. The latter may indicate that electrons are more sensitive to ageing than those of holes.
Text
CEIDP2015-000425.pdf
- Accepted Manuscript
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Published date: 18 October 2015
Venue - Dates:
IEEE Conference on Electrical Insulation and Dielectric Phenomena, Ann Arbor, United States, 2015-10-18 - 2015-10-20
Organisations:
EEE
Identifiers
Local EPrints ID: 383633
URI: http://eprints.soton.ac.uk/id/eprint/383633
ISBN: 9781467374989
PURE UUID: 7e0bc1d6-09af-464b-9817-092e0a7ceba4
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Date deposited: 30 Nov 2015 11:27
Last modified: 14 Mar 2024 21:45
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Contributors
Author:
Ning Liu
Author:
Ziyun Li
Author:
George Chen
Author:
Mingli Fu
Author:
Ruihai Li
Author:
Shuai Hou
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