A silicon structure for electrical characterisation of nanoscale elements


Sazio, P.J.A., Berg, J., See, P., Ford, C.J.B., Lundgren, P., Greenham, N.C., Ginger, D.S., Bengtsson, S. and Chin, S.N. (2001) A silicon structure for electrical characterisation of nanoscale elements. In, 2001 MRS Spring Meeting, San Francisco, USA, 16 - 20 Apr 2001. 6pp.

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Description/Abstract

The problem of mass manufacturing electrode structures suitable for contacting nanoscale elements lies primarily in the difficulty of fabricating a nanometre-scale gap between two electrodes in a well controlled, highly parallel manner. In ULSI circuit production, the gate and substrate in MOSFETs are routinely fabricated with a precise vertical spacing of 3 nm between them.

In this work, we have investigated a number of highly parallel methods for the generation of nanogaps, including reconfiguration of the ubiquitous MOS device structure. The silicon dioxide layer that provides vertical separation and electrical insulation between two regions of silicon (the crystalline substrate and the poly-crystalline gate) gives a leakage current of 1 nA µm. In the future this kind of device has the potential to provide a bolt-on technology for the fabrication of ULSI circuits in which conventional CMOS devices are directly hybridised with functional nanoscale elements.

Item Type: Conference or Workshop Item (Paper)
Additional Information: Symposium B: Molecular and Biomolecular Electronics. Paper: B2.3
Related URLs:
Subjects: Q Science > QC Physics
T Technology > TK Electrical engineering. Electronics Nuclear engineering
T Technology > TS Manufactures
Divisions : University Structure - Pre August 2011 > Optoelectronics Research Centre
ePrint ID: 38969
Accepted Date and Publication Date:
Status
April 2001Made publicly available
Date Deposited: 20 Jun 2006
Last Modified: 05 Nov 2016 22:54
URI: http://eprints.soton.ac.uk/id/eprint/38969

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