Abbas, Haider, Zwolinski, Mark and Halak, Basel (2016) NBTI and PBTI Mitigation Techniques by Architectural Anti-Aging Patterns. 17th International Workshop on Microprocessor/SoC Test and Verification (MTV 2016), United States, United States. (In Press)
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Accepted/In Press date: 31 December 2016
Venue - Dates:
17th International Workshop on Microprocessor/SoC Test and Verification (MTV 2016), United States, United States, 2016-12-31
Organisations:
Electronics & Computer Science
Identifiers
Local EPrints ID: 405643
URI: http://eprints.soton.ac.uk/id/eprint/405643
PURE UUID: a3dab0e8-8d9d-4469-bd01-8819e330dbbe
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Date deposited: 08 Feb 2017 11:25
Last modified: 19 Dec 2023 02:47
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Contributors
Author:
Haider Abbas
Author:
Mark Zwolinski
Author:
Basel Halak
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