Reed, Graham, Milošević, Milan, Chen, Xia, Cao, Wei, Wang, Hong, Khokhar, Ali and Thomson, David (2017) Ion implantation in silicon to facilitate testing of photonic circuits. p. 1010709 . (doi:10.1117/12.2252770).
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Ion implantation in silicon to facilitate testing of photonic circuits
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Published date: 20 February 2017
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Local EPrints ID: 412148
URI: http://eprints.soton.ac.uk/id/eprint/412148
PURE UUID: 169dde5c-bc47-45f0-8956-6a1f4759af3c
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Date deposited: 11 Jul 2017 16:32
Last modified: 26 Apr 2024 17:26
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Author:
Graham Reed
Author:
Milan Milošević
Author:
Xia Chen
Author:
Wei Cao
Author:
Hong Wang
Author:
Ali Khokhar
Author:
David Thomson
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