High-throughput structure/function screening of materials and catalysts with multiple spectroscopic techniques


Tromp, Moniek, Russu, Sergio, Dent, Andy J., Mosselmans, Fred W., Harvey, Ian, Hayama, Shu, Russell, Andrea E., Guerin, Sam, Hayden, Brian E., Suchsland, Jens-Peter, Meacham, Ken, Surridge, Michael, Frey, Jeremy G., Tsapatsaris, Nikolaos, Beesley, Angela M., Schroeder, Sven L.M., Newton, Mark A., Fiddy, Steven, Safonova, Olga V., Glatzel, Pieter, Binsted, Norman and Evans, John (2007) High-throughput structure/function screening of materials and catalysts with multiple spectroscopic techniques. AIP Conference Proceedings, 882, 858-860. (doi:10.1063/1.2644684).

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Original Publication URL: http://dx.doi.org/10.1063/1.2644684

Description/Abstract

High throughput screening methodologies are expanded to synchrotron based x-ray absorption techniques. An environmental chamber, based on ultra-high vacuum equipment, has been developed allowing in situ studies on arrays of samples while X-ray absorption fine structure spectroscopy, Raman spectroscopy, mass spectrometry and/or Xray diffraction can be applied simultaneously to characterize the system under process conditions in a time-resolved manner. The chamber accommodates a diverse range of samples from surface science to materials chemistry to
heterogeneous catalysis. Data acquisition and data logging software is developed to handle large quantities of divers but
related information. New data logging, processing and analysis procedures and programs are developed which will allow fast structure-function relationships characterization.

Item Type: Article
Additional Information: X-Ray Absorption Fine Structure - XAFS13: 13th International Conference
ISSNs: 0094-243X (print)
Related URLs:
Keywords: high throughput, combined characterization techniques, instrument development, software development, xafs, in situ, e-science
Subjects: Q Science > QD Chemistry
Q Science > QC Physics
Divisions: University Structure - Pre August 2011 > School of Chemistry
Item ID: 47110
Date Deposited: 26 Jul 2007
Last Modified: 08 Jun 2012 12:17
Contributors: Tromp, Moniek (Author)
Russu, Sergio (Author)
Dent, Andy J. (Author)
Mosselmans, Fred W. (Author)
Harvey, Ian (Author)
Hayama, Shu (Author)
Russell, Andrea E. (Author)
Guerin, Sam (Author)
Hayden, Brian E. (Author)
Suchsland, Jens-Peter (Author)
Meacham, Ken (Author)
Surridge, Michael (Author)
Frey, Jeremy G. (Author)
Tsapatsaris, Nikolaos (Author)
Beesley, Angela M. (Author)
Schroeder, Sven L.M. (Author)
Newton, Mark A. (Author)
Fiddy, Steven (Author)
Safonova, Olga V. (Author)
Glatzel, Pieter (Author)
Binsted, Norman (Author)
Evans, John (Author)
Date: 2 February 2007
Additional Information: X-Ray Absorption Fine Structure - XAFS13: 13th International Conference
Status: Published
Contact Email Address: m.tromp@soton.ac.uk
URI: http://eprints.soton.ac.uk/id/eprint/47110

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