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High-throughput structure/function screening of materials and catalysts with multiple spectroscopic techniques

High-throughput structure/function screening of materials and catalysts with multiple spectroscopic techniques
High-throughput structure/function screening of materials and catalysts with multiple spectroscopic techniques
High throughput screening methodologies are expanded to synchrotron based x-ray absorption techniques. An environmental chamber, based on ultra-high vacuum equipment, has been developed allowing in situ studies on arrays of samples while X-ray absorption fine structure spectroscopy, Raman spectroscopy, mass spectrometry and/or Xray diffraction can be applied simultaneously to characterize the system under process conditions in a time-resolved manner. The chamber accommodates a diverse range of samples from surface science to materials chemistry to heterogeneous catalysis. Data acquisition and data logging software is developed to handle large quantities of divers but related information. New data logging, processing and analysis procedures and programs are developed which will allow fast structure-function relationships characterization.
high throughput, combined characterization techniques, instrument development, software development, xafs, in situ, e-science
1551-7616
858-860
Tromp, Moniek
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Russu, Sergio
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Dent, Andy J.
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Mosselmans, Fred W.
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Harvey, Ian
c7d85326-0c7a-47b5-a50b-fd6bfebbe3cd
Hayama, Shu
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Russell, Andrea E.
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Guerin, Sam
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Hayden, Brian E.
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Suchsland, Jens-Peter
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Meacham, Ken
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Surridge, Michael
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Frey, Jeremy G.
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Tsapatsaris, Nikolaos
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Beesley, Angela M.
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Schroeder, Sven L.M.
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Newton, Mark A.
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Fiddy, Steven
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Safonova, Olga V.
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Glatzel, Pieter
e3df958e-8db5-48d0-8352-6dbac7a92a43
Binsted, Norman
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Evans, John
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Tromp, Moniek
48c1ebbb-579c-42b6-83bb-7188c668b322
Russu, Sergio
14a025c2-fb85-4fe1-8cb6-da9205fcfbd6
Dent, Andy J.
43d27d73-de43-4e9a-a21e-65c6095a7bf4
Mosselmans, Fred W.
186e47ae-2987-407b-b8f8-0dc2119adcdd
Harvey, Ian
c7d85326-0c7a-47b5-a50b-fd6bfebbe3cd
Hayama, Shu
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Russell, Andrea E.
b6b7c748-efc1-4d5d-8a7a-8e4b69396169
Guerin, Sam
e185e0c2-85c6-4d1c-a2cf-cd2f410d346f
Hayden, Brian E.
aea74f68-2264-4487-9d84-5b12ddbbb331
Suchsland, Jens-Peter
3251dda4-1257-44af-b894-846ef5298133
Meacham, Ken
3d0e5c6b-8a98-4f2f-be51-aef0dad61fa5
Surridge, Michael
3bd360fa-1962-4992-bb16-12fc4dd7d9a9
Frey, Jeremy G.
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Tsapatsaris, Nikolaos
2f279771-c8da-4e97-9e7c-39c9988e9ee9
Beesley, Angela M.
f1942098-5b05-4e2f-ad2b-c797e11aff46
Schroeder, Sven L.M.
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Newton, Mark A.
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Fiddy, Steven
4bd733e0-36d4-4d9f-8f2b-d1ccad3b867c
Safonova, Olga V.
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Glatzel, Pieter
e3df958e-8db5-48d0-8352-6dbac7a92a43
Binsted, Norman
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Evans, John
05890433-0155-49fe-a65d-38c90ea25c69

Tromp, Moniek, Russu, Sergio, Dent, Andy J., Mosselmans, Fred W., Harvey, Ian, Hayama, Shu, Russell, Andrea E., Guerin, Sam, Hayden, Brian E., Suchsland, Jens-Peter, Meacham, Ken, Surridge, Michael, Frey, Jeremy G., Tsapatsaris, Nikolaos, Beesley, Angela M., Schroeder, Sven L.M., Newton, Mark A., Fiddy, Steven, Safonova, Olga V., Glatzel, Pieter, Binsted, Norman and Evans, John (2007) High-throughput structure/function screening of materials and catalysts with multiple spectroscopic techniques. AIP Conference Proceedings, 882, 858-860. (doi:10.1063/1.2644684).

Record type: Article

Abstract

High throughput screening methodologies are expanded to synchrotron based x-ray absorption techniques. An environmental chamber, based on ultra-high vacuum equipment, has been developed allowing in situ studies on arrays of samples while X-ray absorption fine structure spectroscopy, Raman spectroscopy, mass spectrometry and/or Xray diffraction can be applied simultaneously to characterize the system under process conditions in a time-resolved manner. The chamber accommodates a diverse range of samples from surface science to materials chemistry to heterogeneous catalysis. Data acquisition and data logging software is developed to handle large quantities of divers but related information. New data logging, processing and analysis procedures and programs are developed which will allow fast structure-function relationships characterization.

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Published date: 2 February 2007
Additional Information: X-Ray Absorption Fine Structure - XAFS13: 13th International Conference
Keywords: high throughput, combined characterization techniques, instrument development, software development, xafs, in situ, e-science
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Identifiers

Local EPrints ID: 47110
URI: http://eprints.soton.ac.uk/id/eprint/47110
DOI: doi:10.1063/1.2644684
ISSN: 1551-7616
PURE UUID: 1b3a7936-fe50-4bdf-b731-3648f3c6cbaf
ORCID for Andrea E. Russell: ORCID iD orcid.org/0000-0002-8382-6443
ORCID for Brian E. Hayden: ORCID iD orcid.org/0000-0002-7762-1812
ORCID for Jeremy G. Frey: ORCID iD orcid.org/0000-0003-0842-4302

Catalogue record

Date deposited: 26 Jul 2007
Last modified: 16 Mar 2024 02:59

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Contributors

Author: Moniek Tromp
Author: Sergio Russu
Author: Andy J. Dent
Author: Fred W. Mosselmans
Author: Ian Harvey
Author: Shu Hayama
Author: Andrea E. Russell ORCID iD
Author: Sam Guerin
Author: Brian E. Hayden ORCID iD
Author: Jens-Peter Suchsland
Author: Ken Meacham
Author: Michael Surridge
Author: Jeremy G. Frey ORCID iD
Author: Nikolaos Tsapatsaris
Author: Angela M. Beesley
Author: Sven L.M. Schroeder
Author: Mark A. Newton
Author: Steven Fiddy
Author: Olga V. Safonova
Author: Pieter Glatzel
Author: Norman Binsted
Author: John Evans

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