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Sample handler for x-ray tomographic microscopy and image-guided failure assessment

Sample handler for x-ray tomographic microscopy and image-guided failure assessment
Sample handler for x-ray tomographic microscopy and image-guided failure assessment
X-ray tomographic microscopy (XTM) yields a three-dimensional data model of an investigated specimen. XTM providing micrometer resolution requires synchrotron light, high resolution area detectors, and a precise sample handler. The sample handler has a height of 270 mm only, is usable for 1 µm resolution, and is able to carry loading machines with a weight of up to 20 kg. This allows exposing samples to load between scans for image-guided failure assessment. This system has been used in the XTM end station of the materials science beamline of the Swiss Light Source at the Paul Scherrer Institut.
0034-6748
076106-[3pp]
Wyss, Peter
37835676-2f92-4df7-bc35-97b2c80c1104
Thurner, Philipp J.
ab711ddd-784e-48de-aaad-f56aec40f84f
Broenniman, Rolf
d3bbabac-65f4-4360-9c64-b01d97c8aa71
Stampanoni, Marco
bfedb3b0-01e8-4e1b-9163-41295b4ceeb1
Sennhauser, Urs
3c0e14aa-da0a-48da-bb7b-c65401b1d01b
Abela, Rafael
32050843-84a9-496b-bf7a-eb495e6a71df
Müller, Ralph
f881853a-540f-48f1-bb6d-e0cf1894e036
Wyss, Peter
37835676-2f92-4df7-bc35-97b2c80c1104
Thurner, Philipp J.
ab711ddd-784e-48de-aaad-f56aec40f84f
Broenniman, Rolf
d3bbabac-65f4-4360-9c64-b01d97c8aa71
Stampanoni, Marco
bfedb3b0-01e8-4e1b-9163-41295b4ceeb1
Sennhauser, Urs
3c0e14aa-da0a-48da-bb7b-c65401b1d01b
Abela, Rafael
32050843-84a9-496b-bf7a-eb495e6a71df
Müller, Ralph
f881853a-540f-48f1-bb6d-e0cf1894e036

Wyss, Peter, Thurner, Philipp J., Broenniman, Rolf, Stampanoni, Marco, Sennhauser, Urs, Abela, Rafael and Müller, Ralph (2005) Sample handler for x-ray tomographic microscopy and image-guided failure assessment. Review of Scientific Instruments, 76, 076106-[3pp]. (doi:10.1063/1.1979475).

Record type: Article

Abstract

X-ray tomographic microscopy (XTM) yields a three-dimensional data model of an investigated specimen. XTM providing micrometer resolution requires synchrotron light, high resolution area detectors, and a precise sample handler. The sample handler has a height of 270 mm only, is usable for 1 µm resolution, and is able to carry loading machines with a weight of up to 20 kg. This allows exposing samples to load between scans for image-guided failure assessment. This system has been used in the XTM end station of the materials science beamline of the Swiss Light Source at the Paul Scherrer Institut.

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More information

Published date: July 2005

Identifiers

Local EPrints ID: 48841
URI: http://eprints.soton.ac.uk/id/eprint/48841
ISSN: 0034-6748
PURE UUID: 67d240c5-4768-4fec-a678-9789e4462edd
ORCID for Philipp J. Thurner: ORCID iD orcid.org/0000-0001-7588-9041

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Date deposited: 16 Oct 2007
Last modified: 15 Mar 2024 09:50

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Contributors

Author: Peter Wyss
Author: Rolf Broenniman
Author: Marco Stampanoni
Author: Urs Sennhauser
Author: Rafael Abela
Author: Ralph Müller

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