Sample handler for x-ray tomographic microscopy and image-guided failure assessment
Wyss, Peter, Thurner, Philipp J., Broenniman, Rolf, Stampanoni, Marco, Sennhauser, Urs, Abela, Rafael and Müller, Ralph (2005) Sample handler for x-ray tomographic microscopy and image-guided failure assessment. Review of Scientific Instruments, 76, 076106-[3pp]. (doi:10.1063/1.1979475).
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Description/Abstract
X-ray tomographic microscopy (XTM) yields a three-dimensional data model of an investigated specimen. XTM providing micrometer resolution requires synchrotron light, high resolution area detectors, and a precise sample handler. The sample handler has a height of 270 mm only, is usable for 1 µm resolution, and is able to carry loading machines with a weight of up to 20 kg. This allows exposing samples to load between scans for image-guided failure assessment. This system has been used in the XTM end station of the materials science beamline of the Swiss Light Source at the Paul Scherrer Institut.
| Item Type: | Article |
|---|---|
| ISSNs: | 0034-6748 (print) |
| Related URLs: | |
| Subjects: | T Technology > T Technology (General) Q Science > Q Science (General) Q Science > QH Natural history > QH301 Biology Q Science > QC Physics |
| Divisions: | University Structure - Pre August 2011 > School of Engineering Sciences > Bioengineering Sciences |
| Item ID: | 48841 |
| Date Deposited: | 16 Oct 2007 |
| Last Modified: | 01 Jun 2011 00:19 |
| Contributors: | Wyss, Peter (Author) Thurner, Philipp J. (Author) Broenniman, Rolf (Author) Stampanoni, Marco (Author) Sennhauser, Urs (Author) Abela, Rafael (Author) Müller, Ralph (Author) |
| Date: | July 2005 |
| Status: | Published |
| URI: | http://eprints.soton.ac.uk/id/eprint/48841 |
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