On recent developments for high-speed atomic force microscopy
On recent developments for high-speed atomic force microscopy
The atomic force microscope (AFM) is limited in imaging speed by the bandwidth and dynamic behavior of the actuators and mechanical parts. For high-speed imaging all AFM components have to be optimized in performance. Here, we present improvements of the force sensor, the scanner, the controller, and the data acquisition system. By combining all these improvements, the next generation AFMs will enable imaging speeds more than two orders of magnitude faster than current commercial AFM systems.
0780390474
261-264
Schitter, Georg
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Fantner, Georg E.
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Kindt, Johannes H.
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Thurner, Philipp J.
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Hansma, Paul K.
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2005
Schitter, Georg
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Fantner, Georg E.
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Kindt, Johannes H.
e85fe547-4187-4ad9-9353-911a9bb84d9b
Thurner, Philipp J.
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Hansma, Paul K.
aeab95c4-0f23-4690-8302-72db3316215d
Schitter, Georg, Fantner, Georg E., Kindt, Johannes H., Thurner, Philipp J. and Hansma, Paul K.
(2005)
On recent developments for high-speed atomic force microscopy.
In Proceedings, 2005 IEEE/ASME International Conference on Advanced Intelligent Mechatronics.
IEEE.
.
(doi:10.1109/AIM.2005.1501000).
Record type:
Conference or Workshop Item
(Paper)
Abstract
The atomic force microscope (AFM) is limited in imaging speed by the bandwidth and dynamic behavior of the actuators and mechanical parts. For high-speed imaging all AFM components have to be optimized in performance. Here, we present improvements of the force sensor, the scanner, the controller, and the data acquisition system. By combining all these improvements, the next generation AFMs will enable imaging speeds more than two orders of magnitude faster than current commercial AFM systems.
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Published date: 2005
Venue - Dates:
IEEE/ASME International Conference on Advanced Intelligent Mechatronics, Monterey, USA, 2005-07-24 - 2005-07-28
Identifiers
Local EPrints ID: 49205
URI: http://eprints.soton.ac.uk/id/eprint/49205
ISBN: 0780390474
PURE UUID: 147515e6-6065-494e-bec3-b4199d84cf65
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Date deposited: 26 Oct 2007
Last modified: 15 Mar 2024 09:54
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Contributors
Author:
Georg Schitter
Author:
Georg E. Fantner
Author:
Johannes H. Kindt
Author:
Paul K. Hansma
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