Harland, C.J., Klein, J.H., Akhter, P. and Venables, J.A. (1978) Electron back-scattering patterns in a field emission gun scanning electron microscope. Sturgess, J.M. (ed.) In Proceedings of the 9th International Congress on Electron Microscopy. Microscopical Society of Canada. pp. 564-565 . (Submitted)
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Submitted date: August 1978
Venue - Dates:
9th International Congress on Electron Microscopy, Toronto, Canada, 1978-08-01 - 1978-08-09
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Local EPrints ID: 51332
URI: http://eprints.soton.ac.uk/id/eprint/51332
PURE UUID: e4564927-592e-4733-86b3-be7f3c49eeb8
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Date deposited: 27 Apr 2009
Last modified: 23 Feb 2023 02:32
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Contributors
Author:
C.J. Harland
Author:
P. Akhter
Author:
J.A. Venables
Editor:
J.M. Sturgess
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