Nanophotonics under the electron microscope


MacDonald, K.F., Denisyuk, A.I., Jonsson, F., Soares, B.F., Bashevoy, M.V. and Zheludev, N.I. (2008) Nanophotonics under the electron microscope. In, 6th International Workshop on Nanophotonics, Taipei, 11 Mar 2008. (Submitted).

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Description/Abstract

The scanning electron microscope (SEM) provides an excellent environment for nanophotonics research, as the electron beam can be used not only for imaging, but also for nanoscale excitation and probing of samples. This talk will review recent studies of optical memory and switching functionalities in gallium nanoparticles performed in an SEM environment.Most recently, it has been found that the phase state of bistable gallium nanoparticles, controlled by optical or electron beam excitations, can be identified via measurements of their cathodoluminescent emission, thus offering an innovative conceptual basis for the development of high density non-volatile phase-change memories. Changes of up to 20% in visible emission intensity are observed following low-fluence optical or electron beam induced phase switching in a monolayer of 60 nm particles.

Item Type: Conference or Workshop Item (Paper)
Related URLs:
Subjects: Q Science
T Technology > TK Electrical engineering. Electronics Nuclear engineering
T Technology
Q Science > QC Physics
Divisions: University Structure - Pre August 2011 > Optoelectronics Research Centre
ePrint ID: 54016
Date Deposited: 21 Aug 2008
Last Modified: 27 Mar 2014 18:37
URI: http://eprints.soton.ac.uk/id/eprint/54016

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