Classification analysis for simulation of machine breakdowns
Lu, L., Currie, C.S.M., Cheng, R.C.H. and Ladbrook, J. (2007) Classification analysis for simulation of machine breakdowns. In, Henderson, S.G., Biller, B., Hsieh, M.-H., Shortle, J., Tew, J.D. and Barton, R.R. (eds.) Proceedings of the 2007 Winter Simulation Conference. Winter Simulation Conference 2007 , Institute of Electrical and Electronics Engineers, 480-487. (doi:10.1109/WSC.2007.4419638).
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Description/Abstract
Machine failure is often an important factor in throughput of manufacturing systems. To simplify the inputs to the simulation model for complex machining and assembly lines, we have derived the Arrows classification method to group similar machines, where one model can be used to describe the breakdown times for all of the machines in the group and breakdown times of machines can be represented by finite mixture model distributions. The Two-Sample Cram´er-von Mises statistic is used to measure the similarity of two sets of data. We evaluate the classification procedure by comparing the throughput of a simulation model when run with mixture models fitted to individual machine breakdown times; mixture models fitted to group breakdown times; and raw data. Details of the methods and results of the grouping processes will be presented, and will be demonstrated using an example.
| Item Type: | Book Section |
|---|---|
| ISBNs: | 9781424413065 (electronic) |
| Keywords: | simulation, classification analysis |
| Subjects: | Q Science > QA Mathematics T Technology > TS Manufactures |
| Divisions: | University Structure - Pre August 2011 > School of Mathematics > Operational Research |
| Item ID: | 54547 |
| Date Deposited: | 28 Jul 2008 |
| Last Modified: | 25 Apr 2013 16:56 |
| Contributors: | Lu, L. (Author) Currie, C.S.M. (Author) Cheng, R.C.H. (Author) Ladbrook, J. (Author) Henderson, S.G. (Editor) Biller, B. (Editor) Hsieh, M.-H. (Editor) Shortle, J. (Editor) Tew, J.D. (Editor) Barton, R.R. (Editor) |
| Date: | December 2007 |
| Status: | Published |
| Publisher: | Institute of Electrical and Electronics Engineers |
| URI: | http://eprints.soton.ac.uk/id/eprint/54547 |
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