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Some new methods for the comparison of two linear regression models

Some new methods for the comparison of two linear regression models
Some new methods for the comparison of two linear regression models
The frequently used approach to the comparison of two linear regression models is to use the partial F test. It is pointed out in this paper that the partial F test has in fact a naturally associated two-sided simultaneous confidence band, which is much more informative than the test itself. But this confidence band is over the entire range of all the covariates. As regression models are true or of interest often only over a restricted region of the covariates, the part of this confidence band outside this region is therefore useless and to ensure 1- simultaneous coverage probability is therefore wasteful of resources. It is proposed that a narrower and hence more efficient confidence band over a restricted region of the covariates should be used. The critical constant required in the construction of this confidence band can be calculated by Monte Carlo simulation. While this two-sided confidence band is suitable for two-sided comparisons of two linear regression models, a more efficient one-sided confidence band can be constructed in a similar way if one is only interested in assessing whether the mean response of one regression model is higher (or lower) than that of the other in the region. The methodologies are illustrated with two examples.
confidence bands, linear regression, multiple comparisons, simultaneous inference, statistical simulation
0378-3758
57-67
Liu, W.
b64150aa-d935-4209-804d-24c1b97e024a
Jamshidian, M.
88395558-70c0-4fc3-ba64-8262acc78068
Zhang, Y.
f812509d-2a3c-41aa-8ba1-68210952d5a6
Bretz, F.
51270819-e491-4a72-a410-679d86231e64
Han, X.L.
15a720d8-bf60-4bac-925d-73136bb787b6
Liu, W.
b64150aa-d935-4209-804d-24c1b97e024a
Jamshidian, M.
88395558-70c0-4fc3-ba64-8262acc78068
Zhang, Y.
f812509d-2a3c-41aa-8ba1-68210952d5a6
Bretz, F.
51270819-e491-4a72-a410-679d86231e64
Han, X.L.
15a720d8-bf60-4bac-925d-73136bb787b6

Liu, W., Jamshidian, M., Zhang, Y., Bretz, F. and Han, X.L. (2007) Some new methods for the comparison of two linear regression models. Journal of Statistical Planning and Inference, 137 (1), 57-67. (doi:10.1016/j.jspi.2005.09.007).

Record type: Article

Abstract

The frequently used approach to the comparison of two linear regression models is to use the partial F test. It is pointed out in this paper that the partial F test has in fact a naturally associated two-sided simultaneous confidence band, which is much more informative than the test itself. But this confidence band is over the entire range of all the covariates. As regression models are true or of interest often only over a restricted region of the covariates, the part of this confidence band outside this region is therefore useless and to ensure 1- simultaneous coverage probability is therefore wasteful of resources. It is proposed that a narrower and hence more efficient confidence band over a restricted region of the covariates should be used. The critical constant required in the construction of this confidence band can be calculated by Monte Carlo simulation. While this two-sided confidence band is suitable for two-sided comparisons of two linear regression models, a more efficient one-sided confidence band can be constructed in a similar way if one is only interested in assessing whether the mean response of one regression model is higher (or lower) than that of the other in the region. The methodologies are illustrated with two examples.

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More information

Submitted date: 17 November 2004
Published date: 1 January 2007
Keywords: confidence bands, linear regression, multiple comparisons, simultaneous inference, statistical simulation

Identifiers

Local EPrints ID: 55161
URI: http://eprints.soton.ac.uk/id/eprint/55161
ISSN: 0378-3758
PURE UUID: ffd618c9-994d-42e6-b5b6-3c4456ad012b
ORCID for W. Liu: ORCID iD orcid.org/0000-0002-4719-0345

Catalogue record

Date deposited: 05 Aug 2008
Last modified: 16 Mar 2024 02:42

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Contributors

Author: W. Liu ORCID iD
Author: M. Jamshidian
Author: Y. Zhang
Author: F. Bretz
Author: X.L. Han

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