Refractive index dispersion of gallium lanthanum sulfide and oxysulfide glasses
Takebe, H., Yayama, H., Morinaga, K., Hewak, D.W. and Fujino, S. (1997) Refractive index dispersion of gallium lanthanum sulfide and oxysulfide glasses. In, 12th International Conference on Optical Fiber Sensors, Williamsburg, US, 28 - 31 Oct 1997.
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Description/Abstract
Gallium lanthanum sulfide-based glasses are attractive for new laser and nonlinear optical applications at near Infrared region. Refractive indexes were measured for Ga2As3-La2S3 and Ga2S3-La2O3 glasses in the range of 0.5 and 1.7µm using the minimum deviation method. Data is analysed by Wemple and Didomenico equation. These glasses have relatively large average electronic bandgaps E in comparison with other chalcogenide glasses. Possible origins of these features are discussed.
| Item Type: | Conference or Workshop Item (Paper) |
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| Related URLs: | |
| Subjects: | Q Science > QC Physics T Technology > TK Electrical engineering. Electronics Nuclear engineering |
| Divisions: | University Structure - Pre August 2011 > Optoelectronics Research Centre |
| Item ID: | 76752 |
| Date Deposited: | 11 Mar 2010 |
| Last Modified: | 25 Apr 2013 21:05 |
| Contributors: | Takebe, H. (Author) Yayama, H. (Author) Morinaga, K. (Author) Hewak, D.W. (Author) Fujino, S. (Author) |
| Date: | 1997 |
| Status: | Unpublished |
| URI: | http://eprints.soton.ac.uk/id/eprint/76752 |
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