Luminescence measurements and properties of Ti:sapphire layers created by PLD

Jelínek, M., Oswald, J., Jastrabík, L., Lančok, J., Nikl, M., Chvostová, D., Eason, R.W., Anderson, A.A., Fotakis, C., Grivas, C., Flory, F., Kubelka, J. and Čtyroký, J. (1996) Luminescence measurements and properties of Ti:sapphire layers created by PLD. In, Photonics, Beijing, CN,


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The development of miniature, compact and efficient lasers compatible with fiber and integrated optics are of great interest from scientific and technological point of view. Planar waveguide lasers are of interest in the last several years. In this work we describe the properties of Ti:sapphire films created on sapphire and quartz substrates by method of pulsed laser deposition (PLD)......

Item Type: Conference or Workshop Item (Paper)
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Subjects: Q Science > QC Physics
T Technology > TK Electrical engineering. Electronics Nuclear engineering
Divisions: University Structure - Pre August 2011 > Optoelectronics Research Centre
ePrint ID: 76867
Date :
Date Event
November 1996["eprint_fieldopt_dates_date_type_delivered" not defined]
Date Deposited: 11 Mar 2010
Last Modified: 31 Mar 2016 13:10

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