Waveguiding and crystallographic properties of single crystal Ti:sapphire layers produced by pulsed laser deposition
Anderson, A.A., Eason, R.W., Jelínek, M., Hickey, L.M.B., Grivas, C., Fotakis, C., Rogers, K. and Lane, D. (1996) Waveguiding and crystallographic properties of single crystal Ti:sapphire layers produced by pulsed laser deposition. In, Conference on Lasers and Electro-Optics Europe, Hamburg, DE,
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Description/Abstract
Layers of Ti:Sapphire were deposited over a range 1300K-1700K, with thicknesses between 1-82 microns on sapphire substrates. These were crystalline over the entire range. Waveguiding was observed without any additional co-dopants.
| Item Type: | Conference or Workshop Item (Paper) |
|---|---|
| Related URLs: | |
| Subjects: | Q Science > QC Physics T Technology > TK Electrical engineering. Electronics Nuclear engineering |
| Divisions: | University Structure - Pre August 2011 > Optoelectronics Research Centre |
| Item ID: | 76936 |
| Date Deposited: | 11 Mar 2010 |
| Last Modified: | 28 Sep 2012 12:33 |
| Contributors: | Anderson, A.A. (Author) Eason, R.W. (Author) Jelínek, M. (Author) Hickey, L.M.B. (Author) Grivas, C. (Author) Fotakis, C. (Author) Rogers, K. (Author) Lane, D. (Author) |
| Date: | September 1996 |
| Status: | Unpublished |
| URI: | http://eprints.soton.ac.uk/id/eprint/76936 |
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