Waveguiding and crystallographic properties of single crystal Ti:sapphire layers produced by pulsed laser deposition


Anderson, A.A., Eason, R.W., Jelínek, M., Hickey, L.M.B., Grivas, C., Fotakis, C., Rogers, K. and Lane, D. (1996) Waveguiding and crystallographic properties of single crystal Ti:sapphire layers produced by pulsed laser deposition. In, Conference on Lasers and Electro-Optics Europe, Hamburg, DE,

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Description/Abstract

Layers of Ti:Sapphire were deposited over a range 1300K-1700K, with thicknesses between 1-82 microns on sapphire substrates. These were crystalline over the entire range. Waveguiding was observed without any additional co-dopants.

Item Type: Conference or Workshop Item (Paper)
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Subjects: Q Science > QC Physics
T Technology > TK Electrical engineering. Electronics Nuclear engineering
Divisions: University Structure - Pre August 2011 > Optoelectronics Research Centre
ePrint ID: 76936
Date Deposited: 11 Mar 2010
Last Modified: 27 Mar 2014 18:56
URI: http://eprints.soton.ac.uk/id/eprint/76936

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