Strong photo-induced refractive index changes in RF-sputtered tantalum oxide planar waveguides


Roe, M.P., Hempstead, M., Archambault, J.L., Russell, P.St.J. and Dong, L. (1994) Strong photo-induced refractive index changes in RF-sputtered tantalum oxide planar waveguides. In, CLEO Europe: Conference on Lasers & Electro-Optics Europe, Amsterdam, NL,

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Description/Abstract

Large negative UV-induced index changes (~ -0.01) have been measured in sputtered tantalum oxide planar waveguides using an optical fibre probe capable of accurately monitoring both the magnitude and the sign of the index change.

Item Type: Conference or Workshop Item (Paper)
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Subjects: Q Science > QC Physics
T Technology > TK Electrical engineering. Electronics Nuclear engineering
Divisions: University Structure - Pre August 2011 > Optoelectronics Research Centre
Faculty of Physical Sciences and Engineering > Optoelectronics Research Centre
ePrint ID: 77143
Date Deposited: 11 Mar 2010
Last Modified: 27 Mar 2014 18:56
URI: http://eprints.soton.ac.uk/id/eprint/77143

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