Strong photo-induced refractive index changes in RF-sputtered tantalum oxide planar waveguides
Roe, M.P., Hempstead, M., Archambault, J.L., Russell, P.St.J. and Dong, L. (1994) Strong photo-induced refractive index changes in RF-sputtered tantalum oxide planar waveguides. In, CLEO Europe: Conference on Lasers & Electro-Optics Europe, Amsterdam, NL,
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Description/Abstract
Large negative UV-induced index changes (~ -0.01) have been measured in sputtered tantalum oxide planar waveguides using an optical fibre probe capable of accurately monitoring both the magnitude and the sign of the index change.
| Item Type: | Conference or Workshop Item (Paper) |
|---|---|
| Related URLs: | |
| Subjects: | Q Science > QC Physics T Technology > TK Electrical engineering. Electronics Nuclear engineering |
| Divisions: | University Structure - Pre August 2011 > Optoelectronics Research Centre Faculty of Physical and Applied Science > Optoelectronics Research Centre |
| Item ID: | 77143 |
| Date Deposited: | 11 Mar 2010 |
| Last Modified: | 07 Sep 2011 14:09 |
| Contributors: | Roe, M.P. (Author) Hempstead, M. (Author) Archambault, J.L. (Author) Russell, P.St.J. (Author) Dong, L. (Author) |
| Date: | 1994 |
| Status: | Published |
| URI: | http://eprints.soton.ac.uk/id/eprint/77143 |
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