Distributed grating sensors using low-coherence reflectometry
Volanthen, M., Geiger, H. and Dakin, J.P. (1997) Distributed grating sensors using low-coherence reflectometry. IEEE Journal of Lightwave Technology, 15, (11), 2076-2082. (doi:10.1109/50.641525 ).
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Description/Abstract
Distributed grating sensors have recently been interrogated with low-coherence reflectometry. Initial results have been enhanced using two new and versatile configurations. The first system tracks the wavelength using a closed-loop scheme, while the second system scans the distance using an open-loop approach. Arbitrary strain and temperature profiles along gratings have been examined with 300 µm spatial resolution and 5.4 με/√Hz accuracy. A theoretical model of the interrogation technique is derived and the predicted performance limits are examined experimentally.
| Item Type: | Article |
|---|---|
| ISSNs: | 0733-8724 (print) 1558-2213 (electronic) |
| Related URLs: | |
| Subjects: | Q Science > QC Physics T Technology > TK Electrical engineering. Electronics Nuclear engineering |
| Divisions: | University Structure - Pre August 2011 > Optoelectronics Research Centre |
| Item ID: | 77970 |
| Date Deposited: | 11 Mar 2010 |
| Last Modified: | 17 Sep 2012 16:13 |
| Contributors: | Volanthen, M. (Author) Geiger, H. (Author) Dakin, J.P. (Author) |
| Date: | 1997 |
| Status: | Published |
| URI: | http://eprints.soton.ac.uk/id/eprint/77970 |
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