High resolution x-ray characterization of periodically domain-inverted nonlinear optical crystals


Hu, Z.W., Thomas, P.A. and Webjörn, J. (1995) High resolution x-ray characterization of periodically domain-inverted nonlinear optical crystals. Journal of Physics D: Applied Physics, 28, (4A), A189-A194. (doi:10.1088/0022-3727/28/4A/037).

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Description/Abstract

A high-resolution triple-axis diffractometer has been used for the structural characterization of periodically domain-inverted nonlinear optical crystals of KTiOPO4 and LNbO3. Striations have been revealed in high strain-sensitivity multiple-crystal topographs of the domain-inverted regions of both these samples and these are dominated by orientation contrast. The combination of high-resolution reciprocal-space mapping and topography has shown that the extended diffraction streak in the q[210] direction for domain-inverted LiNbO3 originates from the "minutely misoriented structure" which is related to the original configuration of dislocations. The reason for the generation of the structural imperfections via the domain-inversion processing is interpreted in terms of the converse piezoelectric effect.

Item Type: Article
ISSNs: 0022-3727 (print)
1361-6463 (electronic)
Related URLs:
Subjects: Q Science > QC Physics
T Technology > TK Electrical engineering. Electronics Nuclear engineering
Divisions: University Structure - Pre August 2011 > Optoelectronics Research Centre
ePrint ID: 78171
Date Deposited: 11 Mar 2010
Last Modified: 27 Mar 2014 18:58
URI: http://eprints.soton.ac.uk/id/eprint/78171

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