In situ measurement of zinc oxide thin film thickness and optical losses


Wacogne, B., Pannell, C.N., Roe, M.P. and Pattinson, T.J. (1995) In situ measurement of zinc oxide thin film thickness and optical losses. Applied Physics Letters, 67, (2), 161-163. (doi:10.1063/1.114653).

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Description/Abstract

We report a simple and accurate interferometric method for simultaneous, in situ measurement of both the thickness and the depth resolved optical losses of thin transparent films. The experimental arrangement is simple, requiring only a laser and a detector regardless of the substrate. The originality of our method is based on the evaluation of the optical losses from the envelopes of the laser signal, while the thickness is measured conventionally by counting the number of signal periods. The technique has been tested while growing ZnO films in a planar RF magnetron sputtering system. Using the above method, the evolution of optical losses is easily observed during deposition, leading to the possibility of a real time control of the film quality. Both theoretical calculations and experimental results are presented in this letter.

Item Type: Article
Additional Information:
ISSNs: 0003-6951 (print)
1077-3118 (electronic)
Related URLs:
Subjects: Q Science > QC Physics
T Technology > TK Electrical engineering. Electronics Nuclear engineering
Divisions: University Structure - Pre August 2011 > Optoelectronics Research Centre
ePrint ID: 78208
Date Deposited: 11 Mar 2010
Last Modified: 27 Mar 2014 18:58
URI: http://eprints.soton.ac.uk/id/eprint/78208

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