Characterisation of Ga-La-S chalcogenide glass thin film optical waveguides, fabricated by pulsed laser deposition


Gill, D.S., Eason, R.W., Zaldo, C., Rutt, H.N. and Vainos, N.A. (1995) Characterisation of Ga-La-S chalcogenide glass thin film optical waveguides, fabricated by pulsed laser deposition. Journal of Non-Crystalline Solids, 191, (3), 321-326. (doi:10.1016/0022-3093(95)00319-3).

Download

Full text not available from this repository.

Description/Abstract

The fabrication of stoichiometric thin-film optical waveguides of Ga-La-S via a pulsed laser deposition technique is reported. Stoichiometric films are grown by ablating Ga-La-S bulk glass with a KrF excimer laser (lambda=248 nm) at an incident laser flux >/= 3.5 J/cm^2. The composition of the films is determined by energy-dispersive X-ray analysis and the refractive index is measured by a dark-mode prism coupling technique. Photoinduced structural rearrangement of the as-deposited films leads to a blueshift in the visible absorption edge and a permanent refractive index change, Deltan, of -1%. On the basis of these results, grating structures have been written with both blue light, and e-beam addressing, and their suitability for integrated optical structures assessed

Item Type: Article
ISSNs: 0022-3093
Related URLs:
Subjects: Q Science > QC Physics
T Technology > TK Electrical engineering. Electronics Nuclear engineering
Divisions: University Structure - Pre August 2011 > Optoelectronics Research Centre
ePrint ID: 78400
Date Deposited: 11 Mar 2010
Last Modified: 27 Mar 2014 18:58
URI: http://eprints.soton.ac.uk/id/eprint/78400

Actions (login required)

View Item View Item