Focused ion beam etched ring-resonator in CVD-grown Ge-Sb-S thin films
Huang, C.C., Ho, Y.-L.D., Knight, K., Rarity, J.G. and Hewak, D.W. (2009) Focused ion beam etched ring-resonator in CVD-grown Ge-Sb-S thin films. In, CLEO Pacific Rim, Shanghai, China, 30 Aug - 03 Sep 2009.
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Description/Abstract
Focused ion beam technique has been applied to fabricate ring resonators in Ge-Sb-S thin films for optoelectronic applications. The CVD-grown Ge-Sb-S thin films have been characterized by micro-Raman, scanning electron microscopy, energy dispersive X-ray analysis and UV-VIS-NIR spectroscopy and the properties of the resonator are being assessed
| Item Type: | Conference or Workshop Item (Paper) |
|---|---|
| Related URLs: | http://www.orc.soton.ac.uk/vie...l?pid=4435 http://www.opticsjournal.net:8...9/CLEO.htm |
| Subjects: | T Technology > TK Electrical engineering. Electronics Nuclear engineering Q Science > QC Physics |
| Divisions: | University Structure - Pre August 2011 > Optoelectronics Research Centre |
| ePrint ID: | 78951 |
| Deposited On: | 19 Mar 2010 |
| Last Modified: | 01 Jun 2011 16:14 |
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