Simultaneous measurement of structure and XUF dielectric constant of nanoscale objects using diffraction of high harmonic radiation
Mills, B., Chau, C.F., Rogers, E.T.F., Grant-Jacob, J., Stebbings, S.L., Praeger, M., de Paula, A.M., Froud, C.A., Chapman, R.T., Butcher, T.J., Brocklesby, W.S. and Frey, J.G. (2009) Simultaneous measurement of structure and XUF dielectric constant of nanoscale objects using diffraction of high harmonic radiation. In, Conference on Lasers and Electro-Optics (CLEO/IQEC 2009), Baltimore, USA,
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Description/Abstract
XUV diffraction using radiation generated by high harmonic generation is used simultaneously to determine both the structure and the complex refractive index of a partially ordered array of 196 nm diameter polystyrene spheres
| Item Type: | Conference or Workshop Item (Paper) |
|---|---|
| Related URLs: | http://www.orc.soton.ac.uk/vie...l?pid=4432 http://www.cleoconference.org/ |
| Subjects: | T Technology > TK Electrical engineering. Electronics Nuclear engineering Q Science > QC Physics |
| Divisions: | University Structure - Pre August 2011 > Optoelectronics Research Centre |
| ePrint ID: | 78953 |
| Deposited On: | 19 Mar 2010 |
| Last Modified: | 22 Dec 2010 14:20 |
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