Nanomaterial structure determination using XUV diffraction
Mills, Ben, Rogers, Edward, Grant-Jacob, James, Butcher, Tom, Stebbings, Sarah, Brocklesby, W.S., Chapman, Richard and Frey, Jeremy (2009) Nanomaterial structure determination using XUV diffraction. In, 2nd European Topical Meeting on Nanophotonics and Metamaterials (NanoMeta), Seefeld, Austria, 05 - 08 Jan 2009.
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Description/Abstract
Diffraction using coherent XUV radiation is used to study the structure of nanophotonic materials, in this case an ordered array of 196nm spheres. Crystal structure and defects are visible, and the nanomaterial dielectric constant determined
| Item Type: | Conference or Workshop Item (Paper) |
|---|---|
| Related URLs: | http://www.orc.soton.ac.uk/vie...l?pid=4258 http://2009.nanometa.org/ |
| Subjects: | T Technology > TK Electrical engineering. Electronics Nuclear engineering Q Science > QC Physics |
| Divisions: | University Structure - Pre August 2011 > Optoelectronics Research Centre |
| ePrint ID: | 78996 |
| Deposited On: | 19 Mar 2010 |
| Last Modified: | 23 Dec 2010 01:31 |
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