In vacuo measurement of the sensitivity limit of planar Bragg sensors


Parker, R.M., Gates, J.C., Sessions, N.P., Kundys, D.O., Gawith, C.B.E., Grossel, M.C. and Smith, P.G.R. (2009) In vacuo measurement of the sensitivity limit of planar Bragg sensors. In, Conference on Lasers and Electro-optics - European Quantum Electronics Conference (CLEO/Europe-EQEC 2009), Munich, Germany, 1pp.

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Original Publication URL: http://www.cleoeurope.org/

Description/Abstract

We present the direct measurement and modeling of the sensitivity limit of an integrated refractive index sensor for the detection of molecular monolayers. Direct UV writing can be used to fabricate a wide range of integrated optical devices particularly Bragg gratings. These Bragg gratings are inherently sensitive to temperature and strain.

Item Type: Conference or Workshop Item (Paper)
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Subjects: Q Science
T Technology > TK Electrical engineering. Electronics Nuclear engineering
T Technology
Q Science > QC Physics
Divisions: University Structure - Pre August 2011 > Optoelectronics Research Centre
Item ID: 78998
Date Deposited: 18 Mar 2010
Last Modified: 08 Jun 2012 12:34
Contributors: Parker, R.M. (Author)
Gates, J.C. (Author)
Sessions, N.P. (Author)
Kundys, D.O. (Author)
Gawith, C.B.E. (Author)
Grossel, M.C. (Author)
Smith, P.G.R. (Author)
Date: June 2009
Status: Published
URI: http://eprints.soton.ac.uk/id/eprint/78998

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