Parker, R.M., Gates, J.C., Sessions, N.P., Kundys, D.O., Gawith, C.B.E., Grossel, M.C. and Smith, P.G.R.
In vacuo measurement of the sensitivity limit of planar Bragg sensors.
In, Conference on Lasers and Electro-optics - European Quantum Electronics Conference (CLEO/Europe-EQEC 2009), Munich, Germany,
14 - 19 Jun 2009.
We present the direct measurement and modeling of the sensitivity limit of an integrated refractive index sensor for the detection of molecular monolayers. Direct UV writing can be used to fabricate a wide range of integrated optical devices particularly Bragg gratings. These Bragg gratings are inherently sensitive to temperature and strain.
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