In vacuo measurement of the sensitivity limit of planar Bragg sensors

Parker, R.M., Gates, J.C., Sessions, N.P., Kundys, D.O., Gawith, C.B.E., Grossel, M.C. and Smith, P.G.R. (2009) In vacuo measurement of the sensitivity limit of planar Bragg sensors. In, Conference on Lasers and Electro-optics - European Quantum Electronics Conference (CLEO/Europe-EQEC 2009), Munich, Germany, 14 - 19 Jun 2009. 1pp. (doi:10.1109/CLEOE-EQEC.2009.5196282).


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We present the direct measurement and modeling of the sensitivity limit of an integrated refractive index sensor for the detection of molecular monolayers. Direct UV writing can be used to fabricate a wide range of integrated optical devices particularly Bragg gratings. These Bragg gratings are inherently sensitive to temperature and strain.

Item Type: Conference or Workshop Item (Paper)
Digital Object Identifier (DOI): doi:10.1109/CLEOE-EQEC.2009.5196282
Related URLs:
Subjects: Q Science > QC Physics
T Technology > TK Electrical engineering. Electronics Nuclear engineering
Divisions: University Structure - Pre August 2011 > Optoelectronics Research Centre
ePrint ID: 78998
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Date Event
June 2009Published
Date Deposited: 18 Mar 2010
Last Modified: 18 Oct 2016 12:56

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