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A novel non destructive method for the determination of transverse critical current distribution in Ag sheathed PbBi2223 tapes

A novel non destructive method for the determination of transverse critical current distribution in Ag sheathed PbBi2223 tapes
A novel non destructive method for the determination of transverse critical current distribution in Ag sheathed PbBi2223 tapes
Significant transverse variation of local critical current density poses one of the most difficult obstacles for the optimisation of 2223 tapes. We present a novel non-destructive method which allows the analysis of transverse Jc distribution with a high spatial resolution. It can be used as an effective tool for routine analysis of Jc distribution for tape optimisation.
0921-4534
2559-2560
Yang, Yifeng
0efc6771-972c-402f-af4f-3468b2991b5c
Hughes, T.
e7ab9d6a-57d7-45d3-9a1b-bc00df50432e
Law, L.N.
1aa9dd0a-af47-40cc-8eac-ce76fec0fecd
Beduz, C.
15245681-77b5-4b29-a8fc-23296f13bc57
Yang, Yifeng
0efc6771-972c-402f-af4f-3468b2991b5c
Hughes, T.
e7ab9d6a-57d7-45d3-9a1b-bc00df50432e
Law, L.N.
1aa9dd0a-af47-40cc-8eac-ce76fec0fecd
Beduz, C.
15245681-77b5-4b29-a8fc-23296f13bc57

Yang, Yifeng, Hughes, T., Law, L.N. and Beduz, C. (1997) A novel non destructive method for the determination of transverse critical current distribution in Ag sheathed PbBi2223 tapes. Physica C: Superconductivity and its Applications, 282-287 (4), 2559-2560. (doi:10.1016/S0921-4534(97)01375-0).

Record type: Article

Abstract

Significant transverse variation of local critical current density poses one of the most difficult obstacles for the optimisation of 2223 tapes. We present a novel non-destructive method which allows the analysis of transverse Jc distribution with a high spatial resolution. It can be used as an effective tool for routine analysis of Jc distribution for tape optimisation.

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Published date: 1997

Identifiers

Local EPrints ID: 21281
URI: http://eprints.soton.ac.uk/id/eprint/21281
ISSN: 0921-4534
PURE UUID: fa43c9f5-27c2-459a-bfc4-bd34416485c4

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Date deposited: 17 Nov 2006
Last modified: 15 Mar 2024 06:29

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Contributors

Author: Yifeng Yang
Author: T. Hughes
Author: L.N. Law
Author: C. Beduz

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