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Frictionally excited thermoelastic instability in multi-disk clutches and brakes

Frictionally excited thermoelastic instability in multi-disk clutches and brakes
Frictionally excited thermoelastic instability in multi-disk clutches and brakes
The propensity toward thermoelastic instability (TEI) in multi-disk clutches and brakes is investigated by introducing a new bidimensional analytical model, where metal and friction disks are replaced by two-dimensional layers of finite thickness. This new model permits to estimate the effect of the thickness ratio a1/a2, between friction and metal disks, on the critical speed, critical wave parameter and migration speed of the sliding system. It is found that as the thickness ratio a1/a2 decreases the critical speed reduces significantly taking up values about 80 percent smaller than that predicted by previous two-dimensional models for commonly used ratios (0.1<a1/a2<1), whilst the critical wave parameter slightly increases. Therefore, not only the susceptibility towards TEI can be reduced by changing the material properties of the friction lining but also by adjusting suitably the thickness ratio of the disks. The two-dimensional model is also employed to determine the critical speed in a real multi-disk clutch, and the results are compared with a three-dimensional finite element code. It is shown that the critical speed estimated by the present two-dimensional plane strain model is in good agreement with that determined by the FE code for sufficiently large radial thickness of the disks, whilst the two-dimensional plane stress solution has to be used for relatively small radial thickness ratios. Also, it is found that the critical number of hot spots is independent of the radial thickness ratio and it is correctly predicted by the two-dimensional model
0742-4787
865-871
Decuzzi, P.
70ed8d0a-f0f2-4510-a749-4c60dcc0eee8
Ciavarella, M.
d5aa6350-b3d4-4a78-a670-9d78242f58c5
Monno, G.
2ed35922-2947-46b7-9633-9cfd1c9fbe07
Decuzzi, P.
70ed8d0a-f0f2-4510-a749-4c60dcc0eee8
Ciavarella, M.
d5aa6350-b3d4-4a78-a670-9d78242f58c5
Monno, G.
2ed35922-2947-46b7-9633-9cfd1c9fbe07

Decuzzi, P., Ciavarella, M. and Monno, G. (2001) Frictionally excited thermoelastic instability in multi-disk clutches and brakes. Journal of Tribology: Transactions of the ASME, 123 (4), 865-871. (doi:10.1115/1.1352740).

Record type: Article

Abstract

The propensity toward thermoelastic instability (TEI) in multi-disk clutches and brakes is investigated by introducing a new bidimensional analytical model, where metal and friction disks are replaced by two-dimensional layers of finite thickness. This new model permits to estimate the effect of the thickness ratio a1/a2, between friction and metal disks, on the critical speed, critical wave parameter and migration speed of the sliding system. It is found that as the thickness ratio a1/a2 decreases the critical speed reduces significantly taking up values about 80 percent smaller than that predicted by previous two-dimensional models for commonly used ratios (0.1<a1/a2<1), whilst the critical wave parameter slightly increases. Therefore, not only the susceptibility towards TEI can be reduced by changing the material properties of the friction lining but also by adjusting suitably the thickness ratio of the disks. The two-dimensional model is also employed to determine the critical speed in a real multi-disk clutch, and the results are compared with a three-dimensional finite element code. It is shown that the critical speed estimated by the present two-dimensional plane strain model is in good agreement with that determined by the FE code for sufficiently large radial thickness of the disks, whilst the two-dimensional plane stress solution has to be used for relatively small radial thickness ratios. Also, it is found that the critical number of hot spots is independent of the radial thickness ratio and it is correctly predicted by the two-dimensional model

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Published date: 2001

Identifiers

Local EPrints ID: 23242
URI: http://eprints.soton.ac.uk/id/eprint/23242
ISSN: 0742-4787
PURE UUID: e869eb53-46e1-40dc-9cf9-4a80333cc092

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Date deposited: 06 Feb 2007
Last modified: 15 Mar 2024 06:45

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Contributors

Author: P. Decuzzi
Author: M. Ciavarella
Author: G. Monno

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