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Noise and other electrical characteristics of CMOSFETS fabricated with furnace, anodic and rapid thermal oxides

Noise and other electrical characteristics of CMOSFETS fabricated with furnace, anodic and rapid thermal oxides
Noise and other electrical characteristics of CMOSFETS fabricated with furnace, anodic and rapid thermal oxides
Adam Hilger
Murray, D.C.
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Carter, J.C.
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Afshar-Hanaii, N.
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Evans, A.G.R.
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Taylor, S.
b4c80437-df15-44fe-beea-ec5de9f558f1
Zhang, J.
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Eccleson, W.
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Murray, D.C.
2bce70f8-76ce-4693-bd84-22f43561e746
Carter, J.C.
6a4e2120-5d03-4621-9ebc-ba8901e40e7a
Afshar-Hanaii, N.
4d2530df-e7b7-4f3f-ac49-9afe1787e1b9
Evans, A.G.R.
c4a3f208-8fd9-491d-870f-ce7eef943311
Taylor, S.
b4c80437-df15-44fe-beea-ec5de9f558f1
Zhang, J.
c191de5a-f35a-4e52-a86d-4fd5c31f3ff6
Eccleson, W.
36b31577-2927-44c3-b828-c8256884a781

Murray, D.C., Carter, J.C., Afshar-Hanaii, N., Evans, A.G.R., Taylor, S., Zhang, J. and Eccleson, W. (1991) Noise and other electrical characteristics of CMOSFETS fabricated with furnace, anodic and rapid thermal oxides.

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More information

Published date: 1991
Additional Information: Address: Bristol
Organisations: Nanoelectronics and Nanotechnology

Identifiers

Local EPrints ID: 252077
URI: http://eprints.soton.ac.uk/id/eprint/252077
PURE UUID: 7721b102-34bc-4789-ac57-7ff53463e7b8

Catalogue record

Date deposited: 09 Dec 1999
Last modified: 10 Dec 2021 20:24

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Contributors

Author: D.C. Murray
Author: J.C. Carter
Author: N. Afshar-Hanaii
Author: A.G.R. Evans
Author: S. Taylor
Author: J. Zhang
Author: W. Eccleson

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