Concurrent Transient Fault Simulation of Nonlinear Analogue Circuits
Concurrent Transient Fault Simulation of Nonlinear Analogue Circuits
In this paper, a new approach for transient concurrent analogue fault simulation is presented. The effectiveness of the technique is evaluated through the use of IEEE Mixed-signal benchmark circuits.
Kilic, Yavuz
a69ba7cd-0ab3-4f59-a863-5945028fa851
Zwolinski, Mark
adfcb8e7-877f-4bd7-9b55-7553b6cb3ea0
2000
Kilic, Yavuz
a69ba7cd-0ab3-4f59-a863-5945028fa851
Zwolinski, Mark
adfcb8e7-877f-4bd7-9b55-7553b6cb3ea0
Kilic, Yavuz and Zwolinski, Mark
(2000)
Concurrent Transient Fault Simulation of Nonlinear Analogue Circuits.
6th International Mixed-Signal Testing Workshop.
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Abstract
In this paper, a new approach for transient concurrent analogue fault simulation is presented. The effectiveness of the technique is evaluated through the use of IEEE Mixed-signal benchmark circuits.
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Published date: 2000
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Organisation: IEEE
Venue - Dates:
6th International Mixed-Signal Testing Workshop, 2000-01-01
Organisations:
EEE
Identifiers
Local EPrints ID: 252983
URI: http://eprints.soton.ac.uk/id/eprint/252983
PURE UUID: 9353d84d-85f2-43d0-b736-2b89a6ab4738
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Date deposited: 01 May 2002
Last modified: 11 Dec 2021 02:43
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Contributors
Author:
Yavuz Kilic
Author:
Mark Zwolinski
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