Howes, R, Redman-White, W, Nicols, K G, Bird, S, Robinson, M and Mole, P J (1991) A charge conserving SOS MOSFET model including radiation effects for circuit simulation.
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Conference or Workshop Item
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Published date: September 1991
Additional Information:
Organisation: Proc Conference on Radiation Effects on Components and Semiconductors, Montpelier, France
Organisations:
Nanoelectronics and Nanotechnology
Identifiers
Local EPrints ID: 253262
URI: http://eprints.soton.ac.uk/id/eprint/253262
PURE UUID: 94e6fa4c-0f3c-41a9-981e-f2b2d17e77ca
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Date deposited: 05 May 2000
Last modified: 10 Dec 2021 20:32
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Contributors
Author:
R Howes
Author:
W Redman-White
Author:
K G Nicols
Author:
S Bird
Author:
M Robinson
Author:
P J Mole
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