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Degradation of dodecylbenzene under conditions of high electric field

Degradation of dodecylbenzene under conditions of high electric field
Degradation of dodecylbenzene under conditions of high electric field
0 85296 730 6
224-9
Huynh, R. L.
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Davis, F. J.
a6cfe6e2-5518-4538-a3d9-d71a24445110
Patel, D.
c8d09f57-2b67-442c-aff3-30deb23f6fcb
Vaughan, A. S.
6d813b66-17f9-4864-9763-25a6d659d8a3
Huynh, R. L.
f9c7d2f2-fe36-4456-b4c4-17a42372c86d
Davis, F. J.
a6cfe6e2-5518-4538-a3d9-d71a24445110
Patel, D.
c8d09f57-2b67-442c-aff3-30deb23f6fcb
Vaughan, A. S.
6d813b66-17f9-4864-9763-25a6d659d8a3

Huynh, R. L., Davis, F. J., Patel, D. and Vaughan, A. S. (2000) Degradation of dodecylbenzene under conditions of high electric field. Proceedings of 8th International Conference on Dielectric Materials, Measurements and Applications. pp. 224-9 .

Record type: Conference or Workshop Item (Other)

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More information

Published date: September 2000
Additional Information: Conference held: Edinburgh, UK, 17-21 September, 2000 Organisation: Institution of Electrical Engineers
Venue - Dates: Proceedings of 8th International Conference on Dielectric Materials, Measurements and Applications, 2000-08-31
Organisations: Electronics & Computer Science, EEE

Identifiers

Local EPrints ID: 254075
URI: http://eprints.soton.ac.uk/id/eprint/254075
ISBN: 0 85296 730 6
PURE UUID: fbb0f5bf-7bb2-45f7-8670-49da8bd25121
ORCID for A. S. Vaughan: ORCID iD orcid.org/0000-0002-0535-513X

Catalogue record

Date deposited: 13 Oct 2000
Last modified: 09 Jan 2022 03:03

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Contributors

Author: R. L. Huynh
Author: F. J. Davis
Author: D. Patel
Author: A. S. Vaughan ORCID iD

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