Kim, Dong-Hun, Park, Il-Han., Shin, Myoung-Chul and Sykulski, J.K. (2002) Generalized Continuum Sensitivity Formula for Optimum Design of Electrode and Dielectric Contours. CEFC'2002 IEEE Conference on Electromagnetic Field Computation, Perugia, Italy. 15 - 18 Jun 2002. p. 295 .
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Published date: June 2002
Additional Information:
Event Dates: 16-19 June 2002
Venue - Dates:
CEFC'2002 IEEE Conference on Electromagnetic Field Computation, Perugia, Italy, 2002-06-15 - 2002-06-18
Organisations:
EEE
Identifiers
Local EPrints ID: 256757
URI: http://eprints.soton.ac.uk/id/eprint/256757
PURE UUID: 1271e45d-d83d-420c-8259-0ea1436e11ac
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Date deposited: 13 Sep 2002
Last modified: 11 Dec 2021 02:37
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Contributors
Author:
Dong-Hun Kim
Author:
Il-Han. Park
Author:
Myoung-Chul Shin
Author:
J.K. Sykulski
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