Are neural network techniques the solution to measurement validation, monitoring and automatic diagnosis of sensor faults?
Are neural network techniques the solution to measurement validation, monitoring and automatic diagnosis of sensor faults?
Gaura, E
1e179d97-c754-4d60-a0b5-4a6f51acbb79
Kraft, Michael
c2ff2439-b909-4af3-824d-9d7c0d14dc3e
2002
Gaura, E
1e179d97-c754-4d60-a0b5-4a6f51acbb79
Kraft, Michael
c2ff2439-b909-4af3-824d-9d7c0d14dc3e
Gaura, E and Kraft, Michael
(2002)
Are neural network techniques the solution to measurement validation, monitoring and automatic diagnosis of sensor faults?
41st SICE Annual Conference (SICE2002), Osaka.
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Published date: 2002
Additional Information:
Event Dates: August 2002
Venue - Dates:
41st SICE Annual Conference (SICE2002), Osaka, 2002-07-31
Organisations:
Nanoelectronics and Nanotechnology
Identifiers
Local EPrints ID: 257816
URI: http://eprints.soton.ac.uk/id/eprint/257816
PURE UUID: 5ce66132-1792-4298-ae96-fe79e2782e3c
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Date deposited: 26 Jun 2003
Last modified: 10 Dec 2021 20:53
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Contributors
Author:
E Gaura
Author:
Michael Kraft
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