Behavioural modelling of analogue faults in VHDL-AMS - A case study
Behavioural modelling of analogue faults in VHDL-AMS - A case study
Analogue fault simulation is needed to evaluate the quality of tests, but is very computationally intensive. Behavioural simulation is more abstract and thus faster than fault simulation. Using a phase-locked loop as a case study, we show how behavioural fault models can be derived from transistor-level fault simulations and that faulty behaviour can be accurately modeled.
fault simulation hardware description languages integrated circuit modelling mixed analogue-digital integrated circuits phase locked loops VHDL-AMS analogue fault simulation behavioural analogue fault modelling behavioural fault models behavioural simulation faulty behaviour modelling intensive computation phase-locked loop transistor-level fault simulation
V632-V635
Brown, AD
5c19e523-65ec-499b-9e7c-91522017d7e0
Zwolinski, M
adfcb8e7-877f-4bd7-9b55-7553b6cb3ea0
2004
Brown, AD
5c19e523-65ec-499b-9e7c-91522017d7e0
Zwolinski, M
adfcb8e7-877f-4bd7-9b55-7553b6cb3ea0
Brown, AD and Zwolinski, M
(2004)
Behavioural modelling of analogue faults in VHDL-AMS - A case study.
2004 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, Vancouver, Canada.
23 - 26 May 2004.
.
Record type:
Conference or Workshop Item
(Paper)
Abstract
Analogue fault simulation is needed to evaluate the quality of tests, but is very computationally intensive. Behavioural simulation is more abstract and thus faster than fault simulation. Using a phase-locked loop as a case study, we show how behavioural fault models can be derived from transistor-level fault simulations and that faulty behaviour can be accurately modeled.
Text
iscas2004.pdf
- Other
Restricted to Registered users only
Request a copy
More information
Published date: 2004
Additional Information:
Event Dates: MAY 23-26, 2004
Venue - Dates:
2004 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, Vancouver, Canada, 2004-05-23 - 2004-05-26
Keywords:
fault simulation hardware description languages integrated circuit modelling mixed analogue-digital integrated circuits phase locked loops VHDL-AMS analogue fault simulation behavioural analogue fault modelling behavioural fault models behavioural simulation faulty behaviour modelling intensive computation phase-locked loop transistor-level fault simulation
Organisations:
EEE
Identifiers
Local EPrints ID: 260391
URI: http://eprints.soton.ac.uk/id/eprint/260391
PURE UUID: 41a0386c-11a1-4808-8a29-b3e6026f0db8
Catalogue record
Date deposited: 27 Jan 2005
Last modified: 15 Mar 2024 02:39
Export record
Contributors
Author:
AD Brown
Author:
M Zwolinski
Download statistics
Downloads from ePrints over the past year. Other digital versions may also be available to download e.g. from the publisher's website.
View more statistics